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NISSAN ARC, Ltd.
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Yokosuka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Half-bridge power semiconductor module and method for manufacturing...
Patent number
10,396,057
Issue date
Aug 27, 2019
NISSAN ARC, LTD.
Satoshi Tanimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for visualizing higher-order structure of transparent optica...
Patent number
6,608,675
Issue date
Aug 19, 2003
Nissan Arc, Ltd.
Ichiro Ishikawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DYNAMIC STATE OBSERVATION SYSTEM
Publication number
20230150393
Publication date
May 18, 2023
NISSAN ARC, LTD.
Takashi MATSUMOTO
B60 - VEHICLES IN GENERAL
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20210384109
Publication date
Dec 9, 2021
NISSAN ARC, LTD.
Satoshi Tanimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HALF-BRIDGE POWER SEMICONDUCTOR MODULE AND METHOD FOR MANUFACTURING...
Publication number
20180240787
Publication date
Aug 23, 2018
NISSAN ARC, LTD.
Satoshi Tanimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Low-friction sliding member and low-friction sliding mechanism usin...
Publication number
20050064196
Publication date
Mar 24, 2005
NISSAN MOTOR CO., LTD.
Jean Michel Martin
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Method of observation by transmission electron microscopy
Publication number
20050042781
Publication date
Feb 24, 2005
Semiconductor Leading Edge Technologies, Inc.
Shinichi Ogawa
G01 - MEASURING TESTING
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last 30 trademarks