OHT INC.

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Hiroshima, JP

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Patents Grantslast 30 patents

Information Patent Grant
Capacitive sensor and manufacturing method of capacitive sensor
- Patent number 11,662,328
- Issue date May 30, 2023
- OHT Inc.
- Toshiro Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance detection area sensor and conductive pattern sensing ap...
- Patent number 11,567,114
- Issue date Jan 31, 2023
- TOHOKU UNIVERSITY
- Shigetoshi Sugawa
- G01 - MEASURING TESTING
Information Patent Grant
Wire harness checker and wire harness checking method
- Patent number 7,495,452
- Issue date Feb 24, 2009
- SUMITOMO WIRING SYSTEMS, LTD.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Conductor inspection apparatus and conductor inspection method
- Patent number 7,332,914
- Issue date Feb 19, 2008
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting electronic circuits
- Patent number 7,239,127
- Issue date Jul 3, 2007
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for inspection instrument and inspection instrument
- Patent number 7,173,445
- Issue date Feb 6, 2007
- OHT Inc.
- Tatsuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspection
- Patent number 7,138,805
- Issue date Nov 21, 2006
- OHT, Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Circuit pattern inspection instrument and pattern inspection method
- Patent number 7,088,107
- Issue date Aug 8, 2006
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 7,049,826
- Issue date May 23, 2006
- OHT Inc.
- Koji Okano
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise active RC signal processing circuit
- Patent number 7,026,870
- Issue date Apr 11, 2006
- OHT, Inc.
- Masataka Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit pattern inspection apparatus, circuit pattern inspection me...
- Patent number 6,995,566
- Issue date Feb 7, 2006
- OHT, Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for substrate displacement detection
- Patent number 6,992,493
- Issue date Jan 31, 2006
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting circuit board
- Patent number 6,972,573
- Issue date Dec 6, 2005
- OHT Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting electronic circuits
- Patent number 6,967,498
- Issue date Nov 22, 2005
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus and inspecting method for circuit board
- Patent number 6,958,619
- Issue date Oct 25, 2005
- OHT, Inc.
- Shuji Yamaoka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Inspection method and apparatus for testing fine pitch traces
- Patent number 6,952,104
- Issue date Oct 4, 2005
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting electrical continuity of circui...
- Patent number 6,947,853
- Issue date Sep 20, 2005
- OHT, Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Circuit pattern inspection device, circuit pattern inspection metho...
- Patent number 6,943,559
- Issue date Sep 13, 2005
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit inspection sensor and inspection system using same
- Patent number 6,933,740
- Issue date Aug 23, 2005
- OHT, Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Inspection unit and method of manufacturing substrate
- Patent number 6,894,515
- Issue date May 17, 2005
- OHT, Inc.
- Koji Okano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for conductive patterns of a circuit board, an...
- Patent number 6,861,863
- Issue date Mar 1, 2005
- OHT Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting a board used in a liquid crysta...
- Patent number 6,859,062
- Issue date Feb 22, 2005
- OHT Inc.
- Tatuhisa Fujii
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Inspecting apparatus and inspecting method for circuit board
- Patent number 6,842,026
- Issue date Jan 11, 2005
- OHT, Inc.
- Shuji Yamaoka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and apparatus for circuit board continuity test, tool for co...
- Patent number 6,825,673
- Issue date Nov 30, 2004
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and sensor
- Patent number 6,734,692
- Issue date May 11, 2004
- OHT Inc.
- Tatuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection
- Patent number 6,710,607
- Issue date Mar 23, 2004
- OHT, Inc.
- Tatuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, inspection method and inspection unit therefor
- Patent number 6,703,849
- Issue date Mar 9, 2004
- OHT Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Sensor probe for use in board inspection and manufacturing method t...
- Patent number 6,614,250
- Issue date Sep 2, 2003
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Board inspection apparatus and board inspection method
- Patent number 6,545,484
- Issue date Apr 8, 2003
- OHT Inc.
- Yasushige Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact board inspection probe
- Patent number 6,201,398
- Issue date Mar 13, 2001
- OHT Inc.
- Naoya Takada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CAPACITIVE SENSOR AND MANUFACTURING METHOD OF CAPACITIVE SENSOR
- Publication number 20220011255
- Publication date Jan 13, 2022
- OHT INC.
- Toshiro YASUDA
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE DETECTION AREA SENSOR AND CONDUCTIVE PATTERN SENSING AP...
- Publication number 20210293866
- Publication date Sep 23, 2021
- TOHOKU UNIVERSITY
- Shigetoshi SUGAWA
- G01 - MEASURING TESTING
Information Patent Application
Wire harness checker and wire harness checking method
- Publication number 20070184686
- Publication date Aug 9, 2007
- SUMITOMO WIRING SYSTEMS, LTD.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting electrical continuity of circui...
- Publication number 20050038613
- Publication date Feb 17, 2005
- OHT INC.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Tester and testing method
- Publication number 20040243345
- Publication date Dec 2, 2004
- OHT INC.
- Tatsuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Application
Sensor probe for use in board inspection and manufacturing method t...
- Publication number 20040027146
- Publication date Feb 12, 2004
- OHT INC.
- Yuji Odan
- G01 - MEASURING TESTING

Organization

Patents Grantslast 30 patents

Capacitive sensor and manufacturing method of capacitive sensor

Capacitance detection area sensor and conductive pattern sensing ap...

Wire harness checker and wire harness checking method

Conductor inspection apparatus and conductor inspection method

Apparatus and method for inspecting electronic circuits

Sensor for inspection instrument and inspection instrument

Device and method for inspection

Circuit pattern inspection instrument and pattern inspection method

Inspection device and inspection method

Low-noise active RC signal processing circuit

Circuit pattern inspection apparatus, circuit pattern inspection me...

Device and method for substrate displacement detection

Device and method for inspecting circuit board

Apparatus and method for inspecting electronic circuits

Inspecting apparatus and inspecting method for circuit board

Inspection method and apparatus for testing fine pitch traces

Apparatus and method for inspecting electrical continuity of circui...

Circuit pattern inspection device, circuit pattern inspection metho...

Electronic circuit inspection sensor and inspection system using same

Inspection unit and method of manufacturing substrate

Inspection apparatus for conductive patterns of a circuit board, an...

Apparatus and method for inspecting a board used in a liquid crysta...

Inspecting apparatus and inspecting method for circuit board

Method and apparatus for circuit board continuity test, tool for co...

Inspection apparatus and sensor

Method and apparatus for inspection

Inspection apparatus, inspection method and inspection unit therefor

Sensor probe for use in board inspection and manufacturing method t...

Board inspection apparatus and board inspection method

Non-contact board inspection probe

Patents Applicationslast 30 patents

CAPACITIVE SENSOR AND MANUFACTURING METHOD OF CAPACITIVE SENSOR

CAPACITANCE DETECTION AREA SENSOR AND CONDUCTIVE PATTERN SENSING AP...

Wire harness checker and wire harness checking method

Apparatus and method for inspecting electrical continuity of circui...

Tester and testing method

Sensor probe for use in board inspection and manufacturing method t...

Trademarklast 30 trademarks