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Okinawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Iterated variational regularization combined with componentwise reg...
Patent number
8,468,189
Issue date
Jun 18, 2013
Okinawa Institute of Science and Technology Promotion Corporation
Ozan Öktem
G01 - MEASURING TESTING
Information
Patent Grant
Aberration correction apparatus that corrects spherical aberration...
Patent number
8,035,086
Issue date
Oct 11, 2011
Hitachi, Ltd.
Yoichi Hirayama
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
Aberration correction apparatus that corrects spherical aberration...
Publication number
20090230317
Publication date
Sep 17, 2009
Hitachi, Ltd.
Yoichi Hirayama
H01 - BASIC ELECTRIC ELEMENTS
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last 30 trademarks