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On-Chip Technologies, Inc.
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Los Gatos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Serially decoded digital device testing
Patent number
7,797,595
Issue date
Sep 14, 2010
On-Chip Technologies, Inc.
Laurence H. Cooke
G11 - INFORMATION STORAGE
Information
Patent Grant
Variable clocked scan test improvements
Patent number
7,353,470
Issue date
Apr 1, 2008
On-Chip Technologies, Inc.
Laurence H. Cooke
G01 - MEASURING TESTING
Information
Patent Grant
Variable clocked scan test circuitry and method
Patent number
7,234,092
Issue date
Jun 19, 2007
On-Chip Technologies, Inc.
Laurence H. Cooke
G01 - MEASURING TESTING
Information
Patent Grant
Accelerated scan circuitry and method for reducing scan test data v...
Patent number
7,200,784
Issue date
Apr 3, 2007
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Grant
Accelerated scan circuitry and method for reducing scan test data v...
Patent number
7,197,681
Issue date
Mar 27, 2007
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Grant
Accelerated scan circuitry and method for reducing scan test data v...
Patent number
7,188,286
Issue date
Mar 6, 2007
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Grant
On-chip service processor
Patent number
7,080,301
Issue date
Jul 18, 2006
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Grant
On-chip service processor
Patent number
6,964,001
Issue date
Nov 8, 2005
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Grant
On-chip service processor for test and debug of integrated circuits
Patent number
6,687,865
Issue date
Feb 3, 2004
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
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Patents Applications
last 30 patents
Information
Patent Application
Serially Decoded Digital Device Testing
Publication number
20090316506
Publication date
Dec 24, 2009
ON-CHIP TECHNOLOGIES, INC.
Laurence H. Cooke
G11 - INFORMATION STORAGE
Information
Patent Application
Variable Clocked Scan Test Improvements
Publication number
20080163020
Publication date
Jul 3, 2008
ON-CHIP TECHNOLOGIES, INC.
Laurence H. Cooke
G01 - MEASURING TESTING
Information
Patent Application
Scan string segmentation for digital test compression
Publication number
20070168798
Publication date
Jul 19, 2007
On-Chip Technologies, Inc.
Laurence H. Cooke
G01 - MEASURING TESTING
Information
Patent Application
Accelerated Scan Circuitry and Method for Reducing Scan Test Data V...
Publication number
20070162803
Publication date
Jul 12, 2007
ON-CHIP TECHNOLOGIES, INC.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Application
Hashing and serial decoding techniques
Publication number
20070050596
Publication date
Mar 1, 2007
On-Chip Technologies, Inc.
Laurence H. Cooke
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Variable clocked scan test improvements
Publication number
20060195746
Publication date
Aug 31, 2006
On-Chip Technologies, Inc.
Laurence H. Cooke
G01 - MEASURING TESTING
Information
Patent Application
On-chip service processor
Publication number
20060064615
Publication date
Mar 23, 2006
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Application
Design techniques to increase testing efficiency
Publication number
20060041798
Publication date
Feb 23, 2006
On-Chip Technologies, Inc.
Laurence H. Cooke
G11 - INFORMATION STORAGE
Information
Patent Application
Accelerated scan circuitry and method for reducing scan test data v...
Publication number
20050154948
Publication date
Jul 14, 2005
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Application
Accelerated scan circuitry and method for reducing scan test data v...
Publication number
20050028060
Publication date
Feb 3, 2005
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Application
On-chip service processor
Publication number
20040187054
Publication date
Sep 23, 2004
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Application
Accelerated scan circuitry and method for reducing scan test data v...
Publication number
20040148554
Publication date
Jul 29, 2004
On-Chip Technologies, Inc.
Bulent Dervisoglu
G01 - MEASURING TESTING
Information
Patent Application
Variable clocked scan test circuitry and method
Publication number
20030229834
Publication date
Dec 11, 2003
On-Chip Technologies, Inc.
Laurence H. Cooke
G01 - MEASURING TESTING