OnWafer Technologies, Inc.

Organization

Pleasant Hill, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for low distortion parameter measurements
- Patent number 7,299,148
- Issue date Nov 20, 2007
- OnWafer Technologies, Inc.
- Dean Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Maintenance unit for a sensor apparatus
- Patent number 7,282,889
- Issue date Oct 16, 2007
- OnWafer Technologies, Inc.
- Mason L. Freed
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Methods and apparatus for equipment matching and characterization
- Patent number 7,212,950
- Issue date May 1, 2007
- OnWafer Technologies, Inc.
- Kameshwar Poolla
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods of and apparatus for controlling process profiles
- Patent number 7,016,754
- Issue date Mar 21, 2006
- OnWafer Technologies, Inc.
- Kameshwar Poolla
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for deriving thermal flux data for processing...
- Patent number 6,907,364
- Issue date Jun 14, 2005
- OnWafer Technologies, Inc.
- Kameshwar Poolla
- G01 - MEASURING TESTING
Information Patent Grant
Data collection methods and apparatus with parasitic correction
- Patent number 6,789,034
- Issue date Sep 7, 2004
- OnWafer Technologies, Inc.
- Mason L. Freed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor geometry correction methods and apparatus
- Patent number 6,741,945
- Issue date May 25, 2004
- OnWafer Technologies, Inc.
- Kameshwar Polla
- G01 - MEASURING TESTING
Information Patent Grant
Data collection and correction methods and apparatus
- Patent number 6,738,722
- Issue date May 18, 2004
- OnWafer Technologies, Inc.
- Kameshwar Polla
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for obtaining data for process operation, opt...
- Patent number 6,691,068
- Issue date Feb 10, 2004
- OnWafer Technologies, Inc.
- Mason L. Freed
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods and apparatus for power control
- Patent number 6,671,660
- Issue date Dec 30, 2003
- OnWafer Technologies, Inc.
- Mason L. Freed
- G08 - SIGNALLING
Information Patent Grant
Data collection methods and apparatus
- Patent number 6,542,835
- Issue date Apr 1, 2003
- OnWafer Technologies, Inc.
- Randall S. Mundt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

Information Trademark
76064102 - ONWAFER
- Serial number 76064102
- Registration number 2789137
- Filing date Jun 6, 2000
- Onwafer Technologies Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

OnWafer Technologies, Inc.

Organization

Patents Grantslast 30 patents

Methods and apparatus for low distortion parameter measurements

Maintenance unit for a sensor apparatus

Methods and apparatus for equipment matching and characterization

Methods of and apparatus for controlling process profiles

Methods and apparatus for deriving thermal flux data for processing...

Data collection methods and apparatus with parasitic correction

Sensor geometry correction methods and apparatus

Data collection and correction methods and apparatus

Methods and apparatus for obtaining data for process operation, opt...

Methods and apparatus for power control

Data collection methods and apparatus

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

76064102 - ONWAFER