Opal Technologies Ltd.

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Nes Ziona, IL

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Patents Grantslast 30 patents

Information Patent Grant
Reliable defect detection using multiple perspective scanning elect...
- Patent number 5,659,172
- Issue date Aug 19, 1997
- Opal Technologies Ltd.
- Mark Wagner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detector with high backscattered electron acceptance for p...
- Patent number 5,466,940
- Issue date Nov 14, 1995
- Opal Technologies Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting surface deviations from a refere...
- Patent number 5,311,288
- Issue date May 10, 1994
- Opal Technologies Ltd.
- Arie Shahar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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