Optical Measurement Technology Development Co., Ltd.

Organization

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Distributed feedback semiconductor laser

    • Patent number 5,289,494
    • Issue date Feb 22, 1994
    • Optical Measurement Technology Development Co., Ltd.
    • Kunio Tada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Avalanche photodiode with AliNAsP cap layer

    • Patent number 5,189,309
    • Issue date Feb 23, 1993
    • Optical Measurement Technology Development Co., Ltd.
    • Morio Wada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Method of fabricating a semiconductor optical device

    • Patent number 5,145,792
    • Issue date Sep 8, 1992
    • Optical Measurement Technology Development Co., Ltd.
    • Takaaki Hirata
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Optical semiconductor device

    • Patent number 5,084,894
    • Issue date Jan 28, 1992
    • Optical Measurement Technology Development Co., Ltd.
    • Eiji Yamamoto
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Semiconductor laser

    • Patent number 5,077,752
    • Issue date Dec 31, 1991
    • Optical Measurement Technology Development Co., Ltd.
    • Kunio Tada
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Optical integrated modulator

    • Patent number 5,061,030
    • Issue date Oct 29, 1991
    • Optical Measurement Technology Development Co., Ltd.
    • Hiroshi Miyamoto
    • G02 - OPTICS

Patents Applicationslast 30 patents

Trademarklast 30 trademarks