Optimal Test Ltd.

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Nes-Zionna, IL

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Patents Grantslast 30 patents

Information Patent Grant
Methods for slow test time detection of an integrated circuit durin...
- Patent number 7,528,622
- Issue date May 5, 2009
- Optimal Test Ltd.
- Gil Balog
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DATALOG MANAGEMENT IN SEMICONDUCTOR TESTING
- Publication number 20090013218
- Publication date Jan 8, 2009
- Optimal Test Ltd.
- Eran ROUSSEAU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Augmenting semiconductor's devices quality and reliability
- Publication number 20080114558
- Publication date May 15, 2008
- OPTIMAL TEST LTD.
- Nir Erez
- G01 - MEASURING TESTING
Information Patent Application
System and methods for test time outlier detection and correction i...
- Publication number 20070132477
- Publication date Jun 14, 2007
- Optimal Test Ltd.
- Gil Balog
- G01 - MEASURING TESTING

Trademarklast 30 trademarks