OptimalTest Ltd.

Organization

Nes-Zionna, IL

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for test time outlier detection and correction...
- Patent number 8,421,494
- Issue date Apr 16, 2013
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for parametric test time reduction
- Patent number 8,112,249
- Issue date Feb 7, 2012
- Optimaltest Ltd
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using a testing scena...
- Patent number 8,069,130
- Issue date Nov 29, 2011
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for test time outlier detection and correction...
- Patent number 7,969,174
- Issue date Jun 28, 2011
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,777,515
- Issue date Aug 17, 2010
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,737,716
- Issue date Jun 15, 2010
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,679,392
- Issue date Mar 16, 2010
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using a testing scena...
- Patent number 7,567,947
- Issue date Jul 28, 2009
- Optimaltest Ltd
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,532,024
- Issue date May 12, 2009
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Augmenting semiconductor's devices quality and reliability
- Patent number 7,340,359
- Issue date Mar 4, 2008
- Optimaltest Ltd
- Nir Erez
- G11 - INFORMATION STORAGE
Information Patent Grant
Optimize parallel testing
- Patent number 7,208,969
- Issue date Apr 24, 2007
- Optimaltest Ltd.
- Avi Golan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...
- Publication number 20130193994
- Publication date Aug 1, 2013
- OptimalTest, Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
MISALIGNMENT INDICATION DECISION SYSTEM AND METHOD
- Publication number 20120123734
- Publication date May 17, 2012
- OptimalTest Ltd.
- Reed LINDE
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...
- Publication number 20120109874
- Publication date May 3, 2012
- OptimalTest Ltd.
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHODS FOR PARAMETRIC TESTING
- Publication number 20110251812
- Publication date Oct 13, 2011
- OptimalTest Ltd.
- Leonid GUROV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...
- Publication number 20110224938
- Publication date Sep 15, 2011
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR BINNING AT FINAL TEST
- Publication number 20110000829
- Publication date Jan 6, 2011
- OptimalTest Ltd.
- Reed Linde
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
System and Methods for Parametric Test Time Reduction
- Publication number 20100161276
- Publication date Jun 24, 2010
- OptimalTest Ltd.
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...
- Publication number 20090265300
- Publication date Oct 22, 2009
- OptimalTest Ltd.
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...
- Publication number 20090192754
- Publication date Jul 30, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE
- Publication number 20090115445
- Publication date May 7, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE
- Publication number 20090119048
- Publication date May 7, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE
- Publication number 20090112501
- Publication date Apr 30, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for semiconductor testing using reference dice
- Publication number 20080007284
- Publication date Jan 10, 2008
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
Optimize parallel testing
- Publication number 20070007981
- Publication date Jan 11, 2007
- OptimalTest Ltd.
- Avi Golan
- G01 - MEASURING TESTING

OptimalTest Ltd.

Organization

Patents Grantslast 30 patents

Systems and methods for test time outlier detection and correction...

System and methods for parametric test time reduction

Methods and systems for semiconductor testing using a testing scena...

Systems and methods for test time outlier detection and correction...

Methods and systems for semiconductor testing using reference dice

Methods and systems for semiconductor testing using reference dice

Methods and systems for semiconductor testing using reference dice

Methods and systems for semiconductor testing using a testing scena...

Methods and systems for semiconductor testing using reference dice

Augmenting semiconductor's devices quality and reliability

Optimize parallel testing

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...

MISALIGNMENT INDICATION DECISION SYSTEM AND METHOD

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...

SYSTEM AND METHODS FOR PARAMETRIC TESTING

SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...

SYSTEM AND METHOD FOR BINNING AT FINAL TEST

System and Methods for Parametric Test Time Reduction

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...

SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE

Methods and systems for semiconductor testing using reference dice

Optimize parallel testing

Trademarklast 30 trademarks