OPTIPRO SYSTEMS, L.L.C

Organization

ONTARIO, NY, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Surface metrology systems and methods thereof
- Patent number 12,123,701
- Issue date Oct 22, 2024
- Optipro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Grant
Modular contact assembly for rotating machine tool
- Patent number 10,391,609
- Issue date Aug 27, 2019
- Optipro Systems, LLC
- Michael J. Cahill
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for precision polishing of optical components
- Patent number 7,901,270
- Issue date Mar 8, 2011
- Optipro Systems, LLC
- Michael J. Bechtold
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240426594
- Publication date Dec 26, 2024
- OptiPro Systems, LLC
- James F. Munro
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC EMISSIONS MACHINING SYSTEMS AND METHODS THEREOF
- Publication number 20240227114
- Publication date Jul 11, 2024
- OptiPro Systems, LLC
- Michael D. RINKUS
- B24 - GRINDING POLISHING
Information Patent Application
REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240230311
- Publication date Jul 11, 2024
- OptiPro Systems, LLC
- Robert D. NIEDERRITER
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC EMISSIONS MACHINING SYSTEMS AND METHODS THEREOF
- Publication number 20240131651
- Publication date Apr 25, 2024
- OptiPro Systems, LLC
- Michael D. RINKUS
- B24 - GRINDING POLISHING
Information Patent Application
NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF
- Publication number 20220349916
- Publication date Nov 3, 2022
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20220049951
- Publication date Feb 17, 2022
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
75168760 - OPTIPRO
- Serial number 75168760
- Registration number 2172300
- Filing date Sep 19, 1996
- CNC Systems, Inc.
- 7 - Machines and machine tools

OPTIPRO SYSTEMS, L.L.C

Organization

Patents Grantslast 30 patents

Surface metrology systems and methods thereof

Modular contact assembly for rotating machine tool

Method and apparatus for precision polishing of optical components

Patents Applicationslast 30 patents

REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

ELASTIC EMISSIONS MACHINING SYSTEMS AND METHODS THEREOF

REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF

ELASTIC EMISSIONS MACHINING SYSTEMS AND METHODS THEREOF

NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

Trademarklast 30 trademarks

75168760 - OPTIPRO