OPTOMETRIX, INC.

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Renton, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Thermal-acoustic scanning systems and methods
- Patent number 7,357,029
- Issue date Apr 15, 2008
- OptoMetrix, Inc.
- Robert A. Falk
- G01 - MEASURING TESTING
Information Patent Grant
Scanning systems and methods with time delay sensing
- Patent number 7,274,027
- Issue date Sep 25, 2007
- Optometrix Inc.
- Robert A. Falk
- G01 - MEASURING TESTING
Information Patent Grant
Focus aid for confocal microscope
- Patent number 6,787,746
- Issue date Sep 7, 2004
- OptoMetrix, Inc.
- Robert A. Falk
- G02 - OPTICS
Information Patent Grant
Schlieren method for imaging semiconductor device properties
- Patent number 6,181,416
- Issue date Jan 30, 2001
- OptoMetrix, Inc.
- Robert Aaron Falk
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging electric fields
- Patent number 5,850,255
- Issue date Dec 15, 1998
- OptoMetrix, Inc.
- R. Aaron Falk
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging semiconductor device properties
- Patent number 5,754,298
- Issue date May 19, 1998
- OptoMetrix, Inc.
- Robert Aaron Falk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC SIGNAL INJECTION MICROSCOPY
- Publication number 20060049839
- Publication date Mar 9, 2006
- OPTOMETRIX, INC.
- Robert A. Falk
- G01 - MEASURING TESTING
Information Patent Application
THERMAL-ACOUSTIC SCANNING SYSTEMS AND METHODS
- Publication number 20050217381
- Publication date Oct 6, 2005
- OPTOMETRIX, INC.
- Robert A. Falk
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SYSTEMS AND METHODS WITH TIME DELAY SENSING
- Publication number 20050205779
- Publication date Sep 22, 2005
- OPTOMETRIX, INC.
- Robert A. Falk
- G02 - OPTICS

Trademarklast 30 trademarks