Osaka Seimitsu Kikai Co., Ltd.

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting profile error of article surface
- Patent number 4,910,561
- Issue date Mar 20, 1990
- Osaka Seimitsu Kikai Co., Ltd.
- Junpei Tsujiuchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical method for detecting errors in shape
- Patent number 4,657,396
- Issue date Apr 14, 1987
- Osaka Seimitsu Kikai Kabushiki Kaisha
- Toshio Honda
- G01 - MEASURING TESTING

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