OXFORD INSTRUMENTS AFM INC

Organization

Pleasanton, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Integrated micro actuator and LVDT for high precision position meas...
- Patent number 10,337,890
- Issue date Jul 2, 2019
- Oxford Instruments AFM Inc.
- Roger Carlos Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 9,696,342
- Issue date Jul 4, 2017
- Oxford Instruments AFM Inc.
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 9,689,890
- Issue date Jun 27, 2017
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transducer assembly with digitally created signals
- Patent number 9,528,859
- Issue date Dec 27, 2016
- Oxford Instruments AFM Inc.
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Grant
Variable density scanning
- Patent number 9,366,693
- Issue date Jun 14, 2016
- Oxford Instruments PLC
- Roger B Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Multiple frequency atomic force microscopy
- Patent number 9,069,007
- Issue date Jun 30, 2015
- Oxford Instruments PLC
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter
- Patent number 9,063,042
- Issue date Jun 23, 2015
- Oxford Instruments PLC
- Flavio Alejandro Bonilla
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transducer assembly with digitally created signals
- Patent number 9,024,623
- Issue date May 5, 2015
- Oxford Instruments PLC
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 8,925,376
- Issue date Jan 6, 2015
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
- Patent number 8,677,809
- Issue date Mar 25, 2014
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated micro actuator and IVDT for high precision position meas...
- Patent number 8,502,525
- Issue date Aug 6, 2013
- Oxford Instruments PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Variable density scanning
- Patent number 8,489,356
- Issue date Jul 16, 2013
- Oxford Instruments, PLC
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Digital Q control for enhanced measurement capability in cantilever...
- Patent number 8,459,102
- Issue date Jun 11, 2013
- Oxford Instruments PLC
- Dan Bocek
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple frequency atomic force microscopy
- Patent number 8,448,501
- Issue date May 28, 2013
- Oxford Instruments PLC
- Roger B Proksch
- B82 - NANO-TECHNOLOGY

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Patents Applicationslast 30 patents

Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Forc...
- Publication number 20190195910
- Publication date Jun 27, 2019
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...
- Publication number 20170299628
- Publication date Oct 19, 2017
- Oxford Instruments AFM Inc
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20170292971
- Publication date Oct 12, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20170254834
- Publication date Sep 7, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20170089733
- Publication date Mar 30, 2017
- OXFORD INSTRUMENTS PLC
- Roger Carlos Proksch
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...
- Publication number 20160282384
- Publication date Sep 29, 2016
- Oxford Instruments AFM Inc
- Roger B Proksch
- G01 - MEASURING TESTING
Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Forc...
- Publication number 20160258980
- Publication date Sep 8, 2016
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20150113687
- Publication date Apr 23, 2015
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Variable Density Scanning
- Publication number 20150026846
- Publication date Jan 22, 2015
- OXFORD INSTRUMENTS AFM INC
- Roger B. Proksch
- G01 - MEASURING TESTING
Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Fore...
- Publication number 20140041084
- Publication date Feb 6, 2014
- Oxford Instruments AFM, Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20130314078
- Publication date Nov 28, 2013
- OXFORD INSTRUMENTS AFM INC
- Roger Proksch
- G01 - MEASURING TESTING

OXFORD INSTRUMENTS AFM INC

Organization

Patents Grantslast 30 patents

Integrated micro actuator and LVDT for high precision position meas...

Quantitative measurements using multiple frequency atomic force mic...

Fully digitally controller for cantilever-based instruments

Transducer assembly with digitally created signals

Variable density scanning

Multiple frequency atomic force microscopy

Nanoindenter

Transducer assembly with digitally created signals

Fully digitally controller for cantilever-based instruments

Thermal measurements using multiple frequency atomic force microscopy

Integrated micro actuator and IVDT for high precision position meas...

Variable density scanning

Digital Q control for enhanced measurement capability in cantilever...

Multiple frequency atomic force microscopy

Patents Applicationslast 30 patents

Material Property Measurements Using Multiple Frequency Atomic Forc...

QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...

Fully Digitally Controller for Cantilever-Based Instruments

Modular Atomic Force Microscope

Integrated Micro Actuator and LVDT for High Precision Position Meas...

QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...

Material Property Measurements Using Multiple Frequency Atomic Forc...

Fully Digitally Controller for Cantilever-Based Instruments

Variable Density Scanning

Material Property Measurements Using Multiple Frequency Atomic Fore...

Integrated Micro Actuator and LVDT for High Precision Position Meas...