Oxford Instruments Analytical Limited

Organization

High Wycombe, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor radiation detector with large active area, and method...
- Patent number 9,548,402
- Issue date Jan 17, 2017
- Oxford Instruments Analytical Oy
- Veikko Kämäräinen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional guard structure and a radiation detector with the same
- Patent number 9,530,902
- Issue date Dec 27, 2016
- Oxford Instruments Analytical Oy
- Pasi Kostamo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer with safety features
- Patent number 9,310,324
- Issue date Apr 12, 2016
- Oxford Instruments Analytical Oy
- Mikko Järvikivi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor detector head and a method for manufacturing the same
- Patent number 9,159,849
- Issue date Oct 13, 2015
- Oxford Instruments Analytical Oy
- Veikko Kämäräinen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor detector with radiation shield
- Patent number 9,123,837
- Issue date Sep 1, 2015
- Oxford Instruments Analytical Oy
- Hans Andersson
- G01 - MEASURING TESTING
Information Patent Grant
Leakage current collection structure and a radiation detector with...
- Patent number 8,921,797
- Issue date Dec 30, 2014
- Oxford Instruments Analytical Oy
- Pasi Kostamo
- G01 - MEASURING TESTING
Information Patent Grant
Radiation window, and a method for its manufacturing
- Patent number 8,494,119
- Issue date Jul 23, 2013
- Oxford Instruments Analytical Oy
- Hans Andersson
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for quantitative analysis of a material
- Patent number 8,222,598
- Issue date Jul 17, 2012
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Method for patterning detector crystal using Q-switched laser
- Patent number 7,727,796
- Issue date Jun 1, 2010
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gas tight radiation window, and a method for its manufacturing
- Patent number 7,660,393
- Issue date Feb 9, 2010
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Window membrane for detector and analyser devices, and a method for...
- Patent number 7,618,906
- Issue date Nov 17, 2009
- Oxford Instruments Analytical Oy
- Tomi Meilahti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for material identification
- Patent number 7,595,489
- Issue date Sep 29, 2009
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analysing a dataset of spectra
- Patent number 7,533,000
- Issue date May 12, 2009
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Solid state ionising radiation detector and method
- Patent number 7,514,691
- Issue date Apr 7, 2009
- Oxford Instruments Analytical Limited
- Graham White
- G01 - MEASURING TESTING
Information Patent Grant
Filter for X-ray radiation, and an arrangement for using filtered X...
- Patent number 7,508,906
- Issue date Mar 24, 2009
- Oxford Instruments Analytical Oy
- Erikki Puusaari
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Compensation for fluctuations over time in the radiation characteri...
- Patent number 7,474,730
- Issue date Jan 6, 2009
- Oxford Instruments Analytical Oy
- Erkki Tapani Puusaari
- G01 - MEASURING TESTING
Information Patent Grant
Selective irradiation of small target area in X-ray fluorescent spe...
- Patent number 7,443,959
- Issue date Oct 28, 2008
- Oxford Instruments Analytical Oy
- Esko Juhani Kantonen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for correcting distortions in electron backscatter diffracti...
- Patent number 7,442,930
- Issue date Oct 28, 2008
- Oxford Instruments Analytical Limited
- Cheng Tsien Chou
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for non-destructive composition analysis of...
- Patent number 7,426,019
- Issue date Sep 16, 2008
- Oxford Instruments Analytical Oy
- Tero Eklin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer having means for producing lowered pres...
- Patent number 7,409,037
- Issue date Aug 5, 2008
- Oxford Instruments Analytical Oy
- Erkki Tapani Puusaari
- G01 - MEASURING TESTING
Information Patent Grant
Practical laser induced breakdown spectroscopy unit
- Patent number 7,394,537
- Issue date Jul 1, 2008
- Oxford Instruments Analytical Oy
- Pamela Lindfors
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and method for determining the material compo...
- Patent number 7,233,643
- Issue date Jun 19, 2007
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube of the end window type, and an X-ray fluorescence analyzer
- Patent number 7,203,283
- Issue date Apr 10, 2007
- Oxford Instruments Analytical Oy
- Erkki Tapani Puusaari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and circuit arrangement for compensating for rate dependent...
- Patent number 7,193,216
- Issue date Mar 20, 2007
- Oxford Instruments Analytical Oy
- Erkki Sakari Kiuru
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sample inspection apparatus
- Patent number 7,151,269
- Issue date Dec 19, 2006
- Oxford Instruments Analytical Ltd.
- Santokh Singh Bhadare
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Superconducting antenna-coupled hot-spot microbolometer, methods fo...
- Patent number 7,078,695
- Issue date Jul 18, 2006
- Oxford Instruments Analytical Oy
- Arttu Luukanen
- G01 - MEASURING TESTING
Information Patent Grant
Measurement arrangement for X-ray fluoresence analysis
- Patent number 7,065,174
- Issue date Jun 20, 2006
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Adapter and analyzer device for performing X-ray fluorescence analy...
- Patent number 7,020,238
- Issue date Mar 28, 2006
- Oxford Instruments Analytical Oy
- Esko Juhani Kantonen
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, arrangement and method for measuring radioactiv...
- Patent number 6,967,329
- Issue date Nov 22, 2005
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Imaging X-ray detector based on direct conversion
- Patent number 6,933,503
- Issue date Aug 23, 2005
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Portable Analyzer Using Optical Emission Spectroscopy
- Publication number 20170146404
- Publication date May 25, 2017
- Oxford Instruments Analytical Oy.
- Tuomas PYLKKANEN
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Radiation Detector with Large Active Area, and Method...
- Publication number 20150162455
- Publication date Jun 11, 2015
- Oxford Instruments Analytical Oy
- Veikko KÄMÄRÄINEN
- G01 - MEASURING TESTING
Information Patent Application
Portable Analyzer with Radiation Safety Features
- Publication number 20150085977
- Publication date Mar 26, 2015
- Oxford Instruments Analytical Oy
- Mikko JÄRVIKIVI
- G01 - MEASURING TESTING
Information Patent Application
X-ray Fluorescence Analyzer With Safety Features
- Publication number 20150085976
- Publication date Mar 26, 2015
- Oxford Instruments Analytical Oy
- Mikko JÄRVIKIVI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor detector head and a method for manufacturing the same
- Publication number 20140346630
- Publication date Nov 27, 2014
- Oxford Instruments Analytical Oy
- Veikko Kämäräinen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Window, And A Method For Its Manufacturing
- Publication number 20110311029
- Publication date Dec 22, 2011
- Oxford Instruments Analytical Oy.
- Hans Andersson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE FILTER
- Publication number 20110168887
- Publication date Jul 14, 2011
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Angus BEWICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CALCULATING THE STRUCTURE OF AN INHOMOGENEOUS SAMPLE
- Publication number 20100030488
- Publication date Feb 4, 2010
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING THE FEASIBILITY OF A PROPOSED STRUCTURE ANALY...
- Publication number 20100017172
- Publication date Jan 21, 2010
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
Gas tight radiation window, and a method for its manufacturing
- Publication number 20080317209
- Publication date Dec 25, 2008
- Oxford Instruments Analytical Oy.
- Heikki Johannes Sipila
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spectrometer with multiple gratings
- Publication number 20080309936
- Publication date Dec 18, 2008
- Oxford Instruments Analytical Oy.
- Mikko Krapu
- G01 - MEASURING TESTING
Information Patent Application
Method for patterning a detector crystal, and a semiconductor detec...
- Publication number 20080265358
- Publication date Oct 30, 2008
- Oxford Instruments Analytical Oy.
- Heikki Johannes Sipila
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Compensation for fluctuations over time in the radiation characteri...
- Publication number 20080095309
- Publication date Apr 24, 2008
- Oxford Instruments Analytical Oy.
- Erkki Tapani Puusaari
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ANALYSING A DATASET OF SPECTRA
- Publication number 20080027676
- Publication date Jan 31, 2008
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE IONISING RADIATION DETECTOR AND METHOD
- Publication number 20070290141
- Publication date Dec 20, 2007
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Graham White
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence analyzer having means for producing lowered pres...
- Publication number 20070269003
- Publication date Nov 22, 2007
- Oxford Instruments Analytical Oy.
- Erkki Tapani Puusaari
- G01 - MEASURING TESTING
Information Patent Application
Collimator for x-ray spectrometry, and an x-ray spectrometric appar...
- Publication number 20070230664
- Publication date Oct 4, 2007
- Oxford Instruments Analytical Oy.
- Heikki Sipila
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY DETECTOR AND METHOD
- Publication number 20070114429
- Publication date May 24, 2007
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Santokh Singh Bhadare
- G01 - MEASURING TESTING
Information Patent Application
Window membrane for detector and analyser devices, and a method for...
- Publication number 20070111617
- Publication date May 17, 2007
- Oxford Instruments Analytical Oy.
- Tomi Meilahti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Material Identification
- Publication number 20060291619
- Publication date Dec 28, 2006
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for non-destructive composition analysis of...
- Publication number 20060262302
- Publication date Nov 23, 2006
- Oxford Instruments Analytical Oy.
- Tero Eklin
- G01 - MEASURING TESTING
Information Patent Application
Measurement apparatus and method for determining the material compo...
- Publication number 20060262900
- Publication date Nov 23, 2006
- Oxford Instruments Analytical Oy.
- Heikki Johannes Sipila
- G01 - MEASURING TESTING
Information Patent Application
Sample inspection apparatus
- Publication number 20060255290
- Publication date Nov 16, 2006
- Oxford Instruments Analytical Limited
- Santokh Singh Bhadare
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for correcting distortions in electron backscatter diffracti...
- Publication number 20060219903
- Publication date Oct 5, 2006
- Oxford Instruments Analytical Limited
- Cheng Tsien Chou
- G01 - MEASURING TESTING
Information Patent Application
Method of analysing crystalline texture
- Publication number 20030130803
- Publication date Jul 10, 2003
- Oxford Instruments Analytical Limited
- Cheng Tsien Chou
- G01 - MEASURING TESTING
Information Patent Application
Electron detection device
- Publication number 20030057377
- Publication date Mar 27, 2003
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- William H. Gilmore
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
79091328 - AZTEC
- Serial number 79091328
- Registration number 4120060
- Filing date Dec 3, 2010
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79076163 - X-MAX
- Serial number 79076163
- Registration number 3818668
- Filing date Nov 25, 2009
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77065377 - OSPREY-800
- Serial number 77065377
- Registration number 3633586
- Filing date Dec 15, 2006
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78175420 - TWIN-X
- Serial number 78175420
- Registration number 2794779
- Filing date Oct 17, 2002
- Oxford Instruments Analytical Limited
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78102699 - AZTEC
- Serial number 78102699
- Registration number 2740362
- Filing date Jan 15, 2002
- Oxford Instruments Analytical Limited
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78085605 - SEMEDX
- Serial number 78085605
- Registration number 2791047
- Filing date Sep 26, 2001
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Oxford Instruments Analytical Limited

Organization

Patents Grantslast 30 patents

Semiconductor radiation detector with large active area, and method...

Two-dimensional guard structure and a radiation detector with the same

X-ray fluorescence analyzer with safety features

Semiconductor detector head and a method for manufacturing the same

Semiconductor detector with radiation shield

Leakage current collection structure and a radiation detector with...

Radiation window, and a method for its manufacturing

Method for quantitative analysis of a material

Method for patterning detector crystal using Q-switched laser

Gas tight radiation window, and a method for its manufacturing

Window membrane for detector and analyser devices, and a method for...

Method and apparatus for material identification

Method and apparatus for analysing a dataset of spectra

Solid state ionising radiation detector and method

Filter for X-ray radiation, and an arrangement for using filtered X...

Compensation for fluctuations over time in the radiation characteri...

Selective irradiation of small target area in X-ray fluorescent spe...

Method for correcting distortions in electron backscatter diffracti...

Method and arrangement for non-destructive composition analysis of...

X-ray fluorescence analyzer having means for producing lowered pres...

Practical laser induced breakdown spectroscopy unit

Measurement apparatus and method for determining the material compo...

X-ray tube of the end window type, and an X-ray fluorescence analyzer

Method and circuit arrangement for compensating for rate dependent...

Sample inspection apparatus

Superconducting antenna-coupled hot-spot microbolometer, methods fo...

Measurement arrangement for X-ray fluoresence analysis

Adapter and analyzer device for performing X-ray fluorescence analy...

Radiation detector, arrangement and method for measuring radioactiv...

Imaging X-ray detector based on direct conversion

Patents Applicationslast 30 patents

Portable Analyzer Using Optical Emission Spectroscopy

Semiconductor Radiation Detector with Large Active Area, and Method...

Portable Analyzer with Radiation Safety Features

X-ray Fluorescence Analyzer With Safety Features

Semiconductor detector head and a method for manufacturing the same

Radiation Window, And A Method For Its Manufacturing

CHARGED PARTICLE FILTER

METHOD OF CALCULATING THE STRUCTURE OF AN INHOMOGENEOUS SAMPLE

METHOD OF DETERMINING THE FEASIBILITY OF A PROPOSED STRUCTURE ANALY...

Gas tight radiation window, and a method for its manufacturing

Spectrometer with multiple gratings

Method for patterning a detector crystal, and a semiconductor detec...

Compensation for fluctuations over time in the radiation characteri...

METHOD AND APPARATUS FOR ANALYSING A DATASET OF SPECTRA

SOLID STATE IONISING RADIATION DETECTOR AND METHOD

X-ray fluorescence analyzer having means for producing lowered pres...

Collimator for x-ray spectrometry, and an x-ray spectrometric appar...

X-RAY DETECTOR AND METHOD

Window membrane for detector and analyser devices, and a method for...

Method and Apparatus for Material Identification

Method and arrangement for non-destructive composition analysis of...

Measurement apparatus and method for determining the material compo...

Sample inspection apparatus

Method for correcting distortions in electron backscatter diffracti...

Method of analysing crystalline texture

Electron detection device

Trademarklast 30 trademarks

79091328 - AZTEC

79076163 - X-MAX

77065377 - OSPREY-800

78175420 - TWIN-X

78102699 - AZTEC

78085605 - SEMEDX