Oxford Instruments Asylum Research, Inc.

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Goleta, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number RE49997
- Issue date Jun 4, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 11,519,935
- Issue date Dec 6, 2022
- Oxford Instruments Asylum Research, Inc.
- Aleks Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 10,557,865
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research, Inc.
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
- Patent number 10,556,793
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AM/FM measurements using multiple frequency atomic force microscopy
- Patent number 10,444,258
- Issue date Oct 15, 2019
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 10,416,190
- Issue date Sep 17, 2019
- Oxford Instruments Asylum Research Inc
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 10,338,096
- Issue date Jul 2, 2019
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 10,054,612
- Issue date Aug 21, 2018
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,921,242
- Issue date Mar 20, 2018
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,841,436
- Issue date Dec 12, 2017
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 9,804,193
- Issue date Oct 31, 2017
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
- Patent number 9,604,846
- Issue date Mar 28, 2017
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,581,616
- Issue date Feb 28, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated micro actuator and LVDT for high precision position meas...
- Patent number 9,518,814
- Issue date Dec 13, 2016
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,453,857
- Issue date Sep 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,383,388
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 9,383,386
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,097,737
- Issue date Aug 4, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FORCE MICROSCOPE
- Publication number 20240012021
- Publication date Jan 11, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleks Labuda
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
Atomic Force Microscope
- Publication number 20220057429
- Publication date Feb 24, 2022
- Oxford Instruments Asylum Research, Inc.
- Aleks Labuda
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20190324054
- Publication date Oct 24, 2019
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190064211
- Publication date Feb 28, 2019
- Oxford Instruments Asylum Research, Inc.
- David A. Grigg
- G01 - MEASURING TESTING
Information Patent Application
AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY
- Publication number 20180292432
- Publication date Oct 11, 2018
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20180128853
- Publication date May 10, 2018
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope with Environmental Controls
- Publication number 20170168089
- Publication date Jun 15, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20170131322
- Publication date May 11, 2017
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20160313369
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Optical Beam Positioning Unit for Atomic Force Microscope
- Publication number 20160313368
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20160169937
- Publication date Jun 16, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope with Environmental Controls
- Publication number 20150338438
- Publication date Nov 26, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20150309071
- Publication date Oct 29, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20150301080
- Publication date Oct 22, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular atomic force microscope with environmental controls
- Publication number 20150150163
- Publication date May 28, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING

Oxford Instruments Asylum Research, Inc.

Organization

Patents Grantslast 30 patents

Automated optimization of AFM light source positioning

Metrological scanning probe microscope

Automated optimization of AFM light source positioning

Atomic force microscope

Quantitative measurements using multiple frequency atomic force mic...

Thermal measurements using multiple frequency atomic force microscopy

AM/FM measurements using multiple frequency atomic force microscopy

Modular atomic force microscope with environmental controls

Metrological scanning probe microscope

Optical beam positioning unit for atomic force microscope

Automated atomic force microscope and the operation thereof

AM/FM measurements using multiple frequency of atomic force microscopy

Metrological scanning probe microscope

Thermal measurements using multiple frequency atomic force microscopy

Modular atomic force microscope with environmental controls

Integrated micro actuator and LVDT for high precision position meas...

AM/FM measurements using multiple frequency of atomic force microscopy

Automated atomic force microscope and the operation thereof

Optical beam positioning unit for atomic force microscope

Modular atomic force microscope with environmental controls

Patents Applicationslast 30 patents

ATOMIC FORCE MICROSCOPE

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

Atomic Force Microscope

Metrological Scanning Probe Microscope

SCANNING PROBE MICROSCOPE

AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY

Metrological Scanning Probe Microscope

Modular Atomic Force Microscope with Environmental Controls

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

Automated Atomic Force Microscope and the Operation Thereof

Optical Beam Positioning Unit for Atomic Force Microscope

Metrological Scanning Probe Microscope

Modular Atomic Force Microscope with Environmental Controls

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

Automated Atomic Force Microscope and the Operation Thereof

Modular atomic force microscope with environmental controls