Park Scientific Instruments Corporation

Organization

Sunnyvale, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope with multimode head
- Patent number 6,130,427
- Issue date Oct 10, 2000
- Park Scientific Instruments
- Sang-Il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having a single viewing device for on-axi...
- Patent number 5,877,891
- Issue date Mar 2, 1999
- Park Scientific Instruments
- Sano-Il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope with integrated optics for attachment to op...
- Patent number 5,866,902
- Issue date Feb 2, 1999
- Park Scientific Instruments
- John D. Alexander
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope for attachment to optical microscope
- Patent number 5,861,624
- Issue date Jan 19, 1999
- Park Scientific Instruments
- John D. Alexander
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope providing unobstructed top down and botto...
- Patent number 5,854,487
- Issue date Dec 29, 1998
- Park Scientific Instruments
- David Braunstein
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Single axis vibration reducing system
- Patent number 5,811,821
- Issue date Sep 22, 1998
- Park Scientific Instruments
- John D. Alexander
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process for transferring microminiature patterns using spin-on glas...
- Patent number 5,743,998
- Issue date Apr 28, 1998
- Park Scientific Instruments
- Sun Woo Park
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Scanning probe microscope having a single viewing device for on-axi...
- Patent number 5,714,756
- Issue date Feb 3, 1998
- Park Scientific Instruments
- Sang-Il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Large stage system for scanning probe microscopes and other instrum...
- Patent number 5,672,816
- Issue date Sep 30, 1997
- Park Scientific Instruments
- Sang-il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope having aligning and adjusting means
- Patent number RE35514
- Issue date May 20, 1997
- Park Scientific Instruments
- Thomas R. Albrecht
- 250 - Radiant energy
Information Patent Grant
Optical system for scanning microscope
- Patent number 5,448,399
- Issue date Sep 5, 1995
- Park Scientific Instruments
- Sang-Il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Piezoresistive cantilever with integral tip for scanning probe micr...
- Patent number 5,444,244
- Issue date Aug 22, 1995
- Park Scientific Instruments Corporation
- Michael D. Kirk
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,376,790
- Issue date Dec 27, 1994
- Park Scientific Instruments
- Frederick I. Linker
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope having aligning and adjusting means
- Patent number 5,157,251
- Issue date Oct 20, 1992
- Park Scientific Instruments
- Thomas R. Albrecht
- B82 - NANO-TECHNOLOGY

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Trademarklast 30 trademarks

Information Trademark
75246713 - BIOPROBE
- Serial number 75246713
- Registration number 2181485
- Filing date Feb 24, 1997
- Park Scientific Instruments Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75161116 - NANOLENS
- Serial number 75161116
- Filing date Sep 5, 1996
- Park Scientific Instruments Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74255929 - PSI
- Serial number 74255929
- Registration number 1795684
- Filing date Mar 16, 1992
- PARK SCIENTIFIC INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74254114 - PARK SCIENTIFIC INSTRUMENTS
- Serial number 74254114
- Registration number 1794176
- Filing date Mar 10, 1992
- PARK SCIENTIFIC INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74254112 - PSI
- Serial number 74254112
- Registration number 1788810
- Filing date Mar 10, 1992
- PARK SCIENTIFIC INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74244981 - AUTOPROBE
- Serial number 74244981
- Registration number 1795669
- Filing date Feb 10, 1992
- PARK SCIENTIFIC INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74242378 - SCANMASTER
- Serial number 74242378
- Registration number 1800005
- Filing date Jan 30, 1992
- PARK SCIENTIFIC INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

NSF Awardslast 12 months

processing...

Count: 1

NSF Awards

Information NSF Award
SBIR PHASE I: Advanced Scanning Probe Microscopy for Electrical Tes...
- Award Id 9561745
- Effective date Mar 1, 1996

Park Scientific Instruments Corporation

Organization

Patents Grantslast 30 patents

Scanning probe microscope with multimode head

Scanning probe microscope having a single viewing device for on-axi...

Atomic force microscope with integrated optics for attachment to op...

Atomic force microscope for attachment to optical microscope

Scanning probe microscope providing unobstructed top down and botto...

Single axis vibration reducing system

Process for transferring microminiature patterns using spin-on glas...

Scanning probe microscope having a single viewing device for on-axi...

Large stage system for scanning probe microscopes and other instrum...

Scanning force microscope having aligning and adjusting means

Optical system for scanning microscope

Piezoresistive cantilever with integral tip for scanning probe micr...

Scanning probe microscope

Scanning force microscope having aligning and adjusting means

Trademarklast 30 trademarks

75246713 - BIOPROBE

75161116 - NANOLENS

74255929 - PSI

74254114 - PARK SCIENTIFIC INSTRUMENTS

74254112 - PSI

74244981 - AUTOPROBE

74242378 - SCANMASTER

NSF Awardslast 12 months

NSF Awards

SBIR PHASE I: Advanced Scanning Probe Microscopy for Electrical Tes...