PDF Solutions, Inc.

Organization

San Jose, CA, US

Ticker Symbols

NASDAQ:PDFS

SERVICES-COMPUTER PROGRAMMING SERVICES
Business Address
333 WEST SAN CARLOS STREET SUITE 700 SAN JOSE CA 95110 4082807900
Mailing Address
333 WEST SAN JOSE STREET SUITE 700 SAN JOSE CA 95110
State Location
CA
State of Incorporation
DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Collaborative learning model for semiconductor applications
- Patent number 12,038,802
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 12,038,476
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
- Patent number 12,020,897
- Issue date Jun 25, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Die level product modeling without die level input data
- Patent number 11,972,987
- Issue date Apr 30, 2024
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Abnormal wafer image classification
- Patent number 11,972,552
- Issue date Apr 30, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rational decision-making tool for semiconductor processes
- Patent number 11,775,714
- Issue date Oct 3, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer bin map based root cause analysis
- Patent number 11,763,446
- Issue date Sep 19, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic window generation for process trace
- Patent number 11,687,439
- Issue date Jun 27, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 11,668,746
- Issue date Jun 6, 2023
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Predicting equipment fail mode from process trace
- Patent number 11,640,328
- Issue date May 2, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern-enhanced spatial correlation of test structures to die leve...
- Patent number 11,640,160
- Issue date May 2, 2023
- PDF Solutions, Inc.
- Richard Burch
- G05 - CONTROLLING REGULATING
Information Patent Grant
Anomalous equipment trace detection and classification
- Patent number 11,609,812
- Issue date Mar 21, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
- Patent number 11,605,526
- Issue date Mar 14, 2023
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Methods for performing a non-contact electrical measurement on a ce...
- Patent number 11,340,293
- Issue date May 24, 2022
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Predicting die susceptible to early lifetime failure
- Patent number 11,328,108
- Issue date May 10, 2022
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for aligning a particle beam and performing a non-contact e...
- Patent number 11,328,899
- Issue date May 10, 2022
- PDF Solutions, Inc.
- Indranil De
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Maintenance scheduling for semiconductor manufacturing equipment
- Patent number 11,295,993
- Issue date Apr 5, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,107,804
- Issue date Aug 31, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G01 - MEASURING TESTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,081,476
- Issue date Aug 3, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,081,477
- Issue date Aug 3, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with test structures and E-beam pads embedded within a contiguou...
- Patent number 11,075,194
- Issue date Jul 27, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Failure detection and classsification using sensor data and/or meas...
- Patent number 11,029,359
- Issue date Jun 8, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating robust machine learning predictions for semiconductor ma...
- Patent number 11,029,673
- Issue date Jun 8, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor yield prediction
- Patent number 11,022,642
- Issue date Jun 1, 2021
- PDF Solutions, Inc.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,018,126
- Issue date May 25, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G01 - MEASURING TESTING
Information Patent Grant
IC with test structures and E-beam pads embedded within a contiguou...
- Patent number 10,978,438
- Issue date Apr 13, 2021
- PDF Solutions, Inc.
- Stephen Lam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterization vehicles for printed circuit board and system design
- Patent number 10,897,814
- Issue date Jan 19, 2021
- PDF Solutions, Inc.
- Brian E. Stine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test structures for measuring silicon thickness in fully depleted s...
- Patent number 10,852,337
- Issue date Dec 1, 2020
- PDF Solutions, Inc.
- Sharad Saxena
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing a semiconductor wafer using non-contact elect...
- Patent number 10,854,522
- Issue date Dec 1, 2020
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Snap-to valid pattern system and method
- Patent number 10,803,221
- Issue date Oct 13, 2020
- PDF Solutions, Inc.
- Elizabeth Lagnese
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Predicting Equipment Fail Mode from Process Trace
- Publication number 20240362106
- Publication date Oct 31, 2024
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20240329128
- Publication date Oct 3, 2024
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20240304414
- Publication date Sep 12, 2024
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-Series Segmentation and Anomaly Detection
- Publication number 20240184283
- Publication date Jun 6, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G05 - CONTROLLING REGULATING
Information Patent Application
Evaluating a Surface Microstructure
- Publication number 20240127420
- Publication date Apr 18, 2024
- PDF Solutions, Inc.
- Peter Kostka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20230377132
- Publication date Nov 23, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20230358804
- Publication date Nov 9, 2023
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20230282444
- Publication date Sep 7, 2023
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20220365134
- Publication date Nov 17, 2022
- PDF SOLUTIONS, INC.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20220336187
- Publication date Oct 20, 2022
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Rational Decision-Making Tool for Semiconductor Processes
- Publication number 20220327268
- Publication date Oct 13, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sequenced Approach For Determining Wafer Path Quality
- Publication number 20220066410
- Publication date Mar 3, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G05 - CONTROLLING REGULATING
Information Patent Application
Pattern-Enhanced Spatial Correlation of Test Structures to Die Leve...
- Publication number 20220043436
- Publication date Feb 10, 2022
- PDF Solutions, Inc.
- Richard Burch
- G05 - CONTROLLING REGULATING
Information Patent Application
Predicting Equipment Fail Mode from Process Trace
- Publication number 20220027230
- Publication date Jan 27, 2022
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic Window Generation for Process Trace
- Publication number 20220027248
- Publication date Jan 27, 2022
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20210342993
- Publication date Nov 4, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Abnormal Wafer Image Classification
- Publication number 20210334608
- Publication date Oct 28, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Rational Decision-Making Tool for Semiconductor Processes
- Publication number 20210294950
- Publication date Sep 23, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Predicting Die Susceptible to Early Lifetime Failure
- Publication number 20210279388
- Publication date Sep 9, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collaborative Learning Model for Semiconductor Applications
- Publication number 20210142122
- Publication date May 13, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING VARIABLE SELECTION AND ROOT CAUSE DISCOVERY BY CUM...
- Publication number 20210117861
- Publication date Apr 22, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE LEVEL PRODUCT MODELING WITHOUT DIE LEVEL INPUT DATA
- Publication number 20210118754
- Publication date Apr 22, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anomalous Equipment Trace Detection and Classification
- Publication number 20210103489
- Publication date Apr 8, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAINTENANCE SCHEDULING FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20200388545
- Publication date Dec 10, 2020
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN
- Publication number 20200120791
- Publication date Apr 16, 2020
- PDF Solutions, Inc.
- Brian E. Stine
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN
- Publication number 20190320525
- Publication date Oct 17, 2019
- PDF Solutions, Inc.
- Brian E. Stine
- G01 - MEASURING TESTING
Information Patent Application
FAILURE DETECTION FOR WIRE BONDING IN SEMICONDUCTORS
- Publication number 20190146032
- Publication date May 16, 2019
- PDF Solutions, Inc.
- Brian Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR PRODUCT WAFER
- Publication number 20180108580
- Publication date Apr 19, 2018
- PDF Solutions, Inc.
- Yih-Yuh Kelvin DOONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURES FOR MEASURING SILICON THICKNESS IN FULLY DEPLETED S...
- Publication number 20170309524
- Publication date Oct 26, 2017
- PDF Solutions, Inc.
- Sharad Saxena
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Containing DOEs of NCEM-enabled Fill Cells
- Publication number 20170178981
- Publication date Jun 22, 2017
- PDF Solutions, Inc.
- Stephen Lam
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
97733196 - PDF/SOLUTIONS
- Serial number 97733196
- Registration number 7465262
- Filing date Dec 27, 2022
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97733191 - PDF SOLUTIONS
- Serial number 97733191
- Registration number 7465261
- Filing date Dec 27, 2022
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87497196 - EXENSIO
- Serial number 87497196
- Registration number 5658887
- Filing date Jun 20, 2017
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87497263 - EXENSIO
- Serial number 87497263
- Registration number 5658888
- Filing date Jun 20, 2017
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87497273 - EXENSIO
- Serial number 87497273
- Registration number 5658889
- Filing date Jun 20, 2017
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87237924 - EXENSIO
- Serial number 87237924
- Registration number 5279802
- Filing date Nov 15, 2016
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87236481 - EXENSIO
- Serial number 87236481
- Registration number 5279795
- Filing date Nov 14, 2016
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86615754 - DIRECTPROBE
- Serial number 86615754
- Filing date Apr 30, 2015
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86613977 - EPROBE
- Serial number 86613977
- Registration number 5070294
- Filing date Apr 29, 2015
- PDF Solutions, Inc.,
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86613106 - EPROBE
- Serial number 86613106
- Registration number 5070293
- Filing date Apr 28, 2015
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86597562 - EXENSIO
- Serial number 86597562
- Registration number 5020166
- Filing date Apr 14, 2015
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86595330 - DIRECTSCAN
- Serial number 86595330
- Filing date Apr 13, 2015
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85127392 - YIELD RAMP SIMULATOR
- Serial number 85127392
- Registration number 3965310
- Filing date Sep 10, 2010
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77048273 - YIELD RAMP SIMULATOR
- Serial number 77048273
- Filing date Nov 20, 2006
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78472891 - PDFX
- Serial number 78472891
- Registration number 3049514
- Filing date Aug 24, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78472894 - PDFX
- Serial number 78472894
- Registration number 3049515
- Filing date Aug 24, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78433346 - DATAPOWER
- Serial number 78433346
- Registration number 3049034
- Filing date Jun 10, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78433341 - DATAPOWER
- Serial number 78433341
- Registration number 3113716
- Filing date Jun 10, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78430983 - WAFERYIELD
- Serial number 78430983
- Filing date Jun 7, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78369434 - PDFASTEST
- Serial number 78369434
- Registration number 3023028
- Filing date Feb 17, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78369436 - UNIVERSAL CHARACTERIZATION VEHICLE
- Serial number 78369436
- Filing date Feb 17, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78369440 - UNIVERSAL CV
- Serial number 78369440
- Registration number 3105897
- Filing date Feb 17, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78369430 - CHARACTERIZATION VEHICLE
- Serial number 78369430
- Registration number 3036922
- Filing date Feb 17, 2004
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78369435 - CV
- Serial number 78369435
- Registration number 3365579
- Filing date Feb 17, 2004
- PDF Solutions, Inc.
- 40 - Treatment of materials
Information Trademark
78223396 - WAMA
- Serial number 78223396
- Registration number 2844814
- Filing date Mar 10, 2003
- WaferYield
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78223034 - WAFER FLOOR PLANNING
- Serial number 78223034
- Filing date Mar 7, 2003
- WaferYield
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78190774 - YIELDCLOSURE
- Serial number 78190774
- Filing date Dec 3, 2002
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78190749 - PDFASTEST
- Serial number 78190749
- Registration number 2836458
- Filing date Dec 3, 2002
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78190771 - PROCESSCLOSURE
- Serial number 78190771
- Filing date Dec 3, 2002
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78190780 - YIELDAWARE
- Serial number 78190780
- Filing date Dec 3, 2002
- PDF Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

PDF Solutions, Inc.

Organization

Ticker Symbols

Business Address

Mailing Address

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State of Incorporation

Patents Grantslast 30 patents

Collaborative learning model for semiconductor applications

Systems, devices, and methods for performing a non-contact electric...

Systems, devices, and methods for aligning a particle beam and perf...

Die level product modeling without die level input data

Abnormal wafer image classification

Rational decision-making tool for semiconductor processes

Wafer bin map based root cause analysis

Automatic window generation for process trace

Systems, devices, and methods for performing a non-contact electric...

Predicting equipment fail mode from process trace

Pattern-enhanced spatial correlation of test structures to die leve...

Anomalous equipment trace detection and classification

Systems, devices, and methods for aligning a particle beam and perf...

Methods for performing a non-contact electrical measurement on a ce...

Predicting die susceptible to early lifetime failure

Methods for aligning a particle beam and performing a non-contact e...

Maintenance scheduling for semiconductor manufacturing equipment

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and E-beam pads embedded within a contiguou...

Failure detection and classsification using sensor data and/or meas...

Generating robust machine learning predictions for semiconductor ma...

Semiconductor yield prediction

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and E-beam pads embedded within a contiguou...

Characterization vehicles for printed circuit board and system design

Test structures for measuring silicon thickness in fully depleted s...

Method for processing a semiconductor wafer using non-contact elect...

Snap-to valid pattern system and method

Patents Applicationslast 30 patents

Predicting Equipment Fail Mode from Process Trace

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

Time-Series Segmentation and Anomaly Detection

Evaluating a Surface Microstructure

Wafer Bin Map Based Root Cause Analysis

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

Rational Decision-Making Tool for Semiconductor Processes

Sequenced Approach For Determining Wafer Path Quality

Pattern-Enhanced Spatial Correlation of Test Structures to Die Leve...

Predicting Equipment Fail Mode from Process Trace

Automatic Window Generation for Process Trace

Wafer Bin Map Based Root Cause Analysis

Abnormal Wafer Image Classification

Rational Decision-Making Tool for Semiconductor Processes

Predicting Die Susceptible to Early Lifetime Failure

Collaborative Learning Model for Semiconductor Applications

MACHINE LEARNING VARIABLE SELECTION AND ROOT CAUSE DISCOVERY BY CUM...

DIE LEVEL PRODUCT MODELING WITHOUT DIE LEVEL INPUT DATA

Anomalous Equipment Trace Detection and Classification

MAINTENANCE SCHEDULING FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT

CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN

CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN

FAILURE DETECTION FOR WIRE BONDING IN SEMICONDUCTORS

METHOD FOR MANUFACTURING A SEMICONDUCTOR PRODUCT WAFER

TEST STRUCTURES FOR MEASURING SILICON THICKNESS IN FULLY DEPLETED S...

Integrated Circuit Containing DOEs of NCEM-enabled Fill Cells

Trademarklast 30 trademarks

97733196 - PDF/SOLUTIONS

97733191 - PDF SOLUTIONS

87497196 - EXENSIO

87497263 - EXENSIO

87497273 - EXENSIO

87237924 - EXENSIO

87236481 - EXENSIO

86615754 - DIRECTPROBE

86613977 - EPROBE

86613106 - EPROBE