PEI Company

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,410,439
- Issue date Apr 2, 2013
- PEI Company
- Hanno Sebastian Von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam for target recovery
- Patent number 7,150,811
- Issue date Dec 19, 2006
- PEI Company
- Brian Miller
- H01 - BASIC ELECTRIC ELEMENTS