Perkin-Elmer Ltd.

Organization

Beaconsfield, GB

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Infrared microscope stage control
- Patent number 6,006,140
- Issue date Dec 21, 1999
- Perkin-Elmer Ltd.
- Ralph L. Carter
- G02 - OPTICS
Information Patent Grant
Probe for spectroscopic analysis
- Patent number 5,974,210
- Issue date Oct 26, 1999
- Perkin-Elmer Ltd.
- Ian Alcock
- G01 - MEASURING TESTING
Information Patent Grant
Microscope aperture control
- Patent number 5,946,131
- Issue date Aug 31, 1999
- Perkin-Elmer Ltd.
- Simon Wells
- G02 - OPTICS
Information Patent Grant
Digitisation of interferograms in Fourier transform spectroscopy
- Patent number 5,914,780
- Issue date Jun 22, 1999
- Perkin-Elmer Ltd.
- Andrew Turner
- G01 - MEASURING TESTING
Information Patent Grant
Carrier and its use in the preparation of samples for spectroscopy
- Patent number 5,877,435
- Issue date Mar 2, 1999
- Perkin-Elmer Ltd.
- Robert A. Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer alignment system utilizing a step calibration
- Patent number 5,825,491
- Issue date Oct 20, 1998
- Perkin-Elmer Ltd.
- David J. Cutler
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer having combined beam splitter compensator plate
- Patent number 5,808,739
- Issue date Sep 15, 1998
- Perkin-Elmer Ltd.
- Andrew Turner
- G01 - MEASURING TESTING
Information Patent Grant
Air crystal and assembly for infrared microspectroscopy
- Patent number 5,729,018
- Issue date Mar 17, 1998
- Perkin-Elmer Ltd.
- Simon A Wells
- G02 - OPTICS
Information Patent Grant
Carrier and its use in the preparation of samples for spectroscopy
- Patent number 5,703,681
- Issue date Dec 30, 1997
- Perkin-Elmer Ltd.
- Robert A. Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing emission of excited radiation in an analytical sample sub...
- Patent number 5,317,378
- Issue date May 31, 1994
- Perkin-Elmer Ltd.
- Henry M. Mould
- G01 - MEASURING TESTING
Information Patent Grant
Liquid gas temperature control apparatus for and methods of depress...
- Patent number 5,271,230
- Issue date Dec 21, 1993
- Perkin-Elmer Ltd.
- Lewis H. Spiess
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Optical slit control apparatus
- Patent number 4,082,461
- Issue date Apr 4, 1978
- Perkin-Elmer Limited
- Henry Manifold Mould
- G01 - MEASURING TESTING
Information Patent Grant
Ratio-recording spectrophotometer with suppression of uncompensation
- Patent number 4,079,256
- Issue date Mar 14, 1978
- Perkin-Elmer Limited
- Michael Alan Ford
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for changing the speed ratio between first and second dis...
- Patent number 4,073,198
- Issue date Feb 14, 1978
- Perkin-Elmer Limited
- Michael A. Ford
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Ink recorder with grooved pressure roller feed
- Patent number 4,062,021
- Issue date Dec 6, 1977
- Perkin-Elmer Limited
- Leonard Harold Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed radiation detector system
- Patent number 4,049,970
- Issue date Sep 20, 1977
- Perkin-Elmer Limited
- Michael Alan Ford
- G01 - MEASURING TESTING
Information Patent Grant
Polarized grating optical odometer
- Patent number 4,040,741
- Issue date Aug 9, 1977
- Perkin-Elmer Limited
- David William Swift
- G01 - MEASURING TESTING
Information Patent Grant
Optical null apparatus
- Patent number 3,975,099
- Issue date Aug 17, 1976
- Perkin-Elmer Limited
- Leonard Harold Taylor
- G01 - MEASURING TESTING

Perkin-Elmer Ltd.

Organization

Patents Grantslast 30 patents

Infrared microscope stage control

Probe for spectroscopic analysis

Microscope aperture control

Digitisation of interferograms in Fourier transform spectroscopy

Carrier and its use in the preparation of samples for spectroscopy

Interferometer alignment system utilizing a step calibration

Interferometer having combined beam splitter compensator plate

Air crystal and assembly for infrared microspectroscopy

Carrier and its use in the preparation of samples for spectroscopy

Enhancing emission of excited radiation in an analytical sample sub...

Liquid gas temperature control apparatus for and methods of depress...

Optical slit control apparatus

Ratio-recording spectrophotometer with suppression of uncompensation

Apparatus for changing the speed ratio between first and second dis...

Ink recorder with grooved pressure roller feed

Pulsed radiation detector system

Polarized grating optical odometer

Optical null apparatus