Phase Metrics, Inc.

Organization

San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring flying height and a real index o...
- Patent number 6,184,992
- Issue date Feb 6, 2001
- Phase Metrics, Inc.
- Carlos A. Durán
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring a small gap using a Savart plate
- Patent number 6,184,993
- Issue date Feb 6, 2001
- Phase Metrics, Inc.
- Carlos A. Durán
- G11 - INFORMATION STORAGE
Information Patent Grant
Loader with a matching finger that loads a head gimbal assembly ont...
- Patent number 6,140,661
- Issue date Oct 31, 2000
- Phase Metrics, Inc.
- Semyon Nodelman
- G11 - INFORMATION STORAGE
Information Patent Grant
Glass substrate inspection apparatus
- Patent number 6,088,092
- Issue date Jul 11, 2000
- Phase Metrics, Inc.
- Li Chen
- G01 - MEASURING TESTING
Information Patent Grant
Low z-height loader for a head gimbal assembly
- Patent number 5,986,451
- Issue date Nov 16, 1999
- Phase Metrics, Inc.
- Aleksandr Kagan
- G11 - INFORMATION STORAGE
Information Patent Grant
Air bearing for a spindle
- Patent number 5,957,588
- Issue date Sep 28, 1999
- Phase Metrics, Inc.
- Michael Wahl
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
End effector for a robotic arm of a disk certifier
- Patent number 5,927,934
- Issue date Jul 27, 1999
- Phase Metrics, Inc.
- Alex Dadiomov
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Piezoelectric nanopositioner
- Patent number 5,903,085
- Issue date May 11, 1999
- Phase Metrics, Inc.
- Raymond Karam
- B82 - NANO-TECHNOLOGY
Information Patent Grant
End effector for a robotic arm of a disk certifier
- Patent number 5,893,699
- Issue date Apr 13, 1999
- Phase Metrics, Inc.
- Alex Dadiomov
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for providing a clock assembly
- Patent number 5,894,374
- Issue date Apr 13, 1999
- Phase Metrics, Inc.
- Alex Moraru
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for detecting defects on a disk using interfer...
- Patent number 5,883,714
- Issue date Mar 16, 1999
- Phase Metrics
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for surface inspection by specular interferome...
- Patent number 5,875,029
- Issue date Feb 23, 1999
- Phase Metrics, Inc.
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Distortion of an isolated pulse
- Patent number 5,872,664
- Issue date Feb 16, 1999
- Phase Metrics, Inc.
- Stephen F. Meier
- G11 - INFORMATION STORAGE
Information Patent Grant
Crash tolerant air bearing spindle
- Patent number 5,845,401
- Issue date Dec 8, 1998
- Phase Metrics, Inc.
- Jeffrey K. Rhoton
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Low noise preamplifier for a magneto-resistive head tester
- Patent number 5,841,318
- Issue date Nov 24, 1998
- Phase Metrics, Inc.
- Robert M. Cram
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for the measurement of defects in magnetic rec...
- Patent number 5,838,510
- Issue date Nov 17, 1998
- Phase Metrics, Inc.
- Michael Inbar
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic media tester which includes a filter that filters the prod...
- Patent number 5,838,153
- Issue date Nov 17, 1998
- Phase Metrics, Inc.
- Michael Inbar
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for testing multiple magnetic recording heads
- Patent number 5,821,746
- Issue date Oct 13, 1998
- Phase Metrics, Inc.
- Rick Shelor
- G11 - INFORMATION STORAGE
Information Patent Grant
Variable pneumatic loader for testing a disk drive head gimbal asse...
- Patent number 5,818,658
- Issue date Oct 6, 1998
- Phase Metrics
- Charles Balster
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact optical glide tester
- Patent number 5,818,592
- Issue date Oct 6, 1998
- Phase Metrics, Inc.
- Kenneth Womack
- G01 - MEASURING TESTING
Information Patent Grant
Thin film flying height calibration disk for calibrating flying hei...
- Patent number 5,808,736
- Issue date Sep 15, 1998
- Phase Metrics, Inc.
- Kenneth H. Womack
- G11 - INFORMATION STORAGE
Information Patent Grant
Optically verified glide
- Patent number 5,805,284
- Issue date Sep 8, 1998
- Phase Metrics, Inc.
- Christopher A. Lacey
- G11 - INFORMATION STORAGE
Information Patent Grant
Pressurized air-ionization ground for an air bearing spindle
- Patent number 5,801,464
- Issue date Sep 1, 1998
- Phase Metrics
- Blasius Brezoczky
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus for combined glide and defect analysis
- Patent number 5,792,947
- Issue date Aug 11, 1998
- Phase Metrics
- Vladimir Pogrebinsky
- G01 - MEASURING TESTING
Information Patent Grant
Combined interferometer/ellipsometer for measuring small spacings
- Patent number 5,793,480
- Issue date Aug 11, 1998
- Phase Metrics, Inc.
- Christopher A. Lacey
- G01 - MEASURING TESTING
Information Patent Grant
Stops and a clutch for a loader that test the flying height of a di...
- Patent number 5,786,677
- Issue date Jul 28, 1998
- Phase Metrics
- John Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Conductive contact for an air bearing spindle
- Patent number 5,783,882
- Issue date Jul 21, 1998
- Phase Metrics
- Blasius Brezoczky
- G11 - INFORMATION STORAGE
Information Patent Grant
Determining the complex refractive index phase offset in interferom...
- Patent number 5,781,299
- Issue date Jul 14, 1998
- Phase Metrics
- Kenneth H. Womack
- G11 - INFORMATION STORAGE
Information Patent Grant
Surface inspection of a disk by diffraction pattern sampling
- Patent number 5,781,649
- Issue date Jul 14, 1998
- Phase Metrics, Inc.
- Blasius Brezoczky
- G01 - MEASURING TESTING
Information Patent Grant
Combined interferometer/polarimeter
- Patent number 5,777,740
- Issue date Jul 7, 1998
- Phase Metrics
- Christopher A. Lacey
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
78034785 - PHOTONIC CERTIFICATION
- Serial number 78034785
- Filing date Nov 10, 2000
- Phase Metrics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78034782 - PHOTONIC CERTIFIER
- Serial number 78034782
- Filing date Nov 10, 2000
- Phase Metrics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75069170 - PARAGLIDE
- Serial number 75069170
- Filing date Mar 8, 1996
- Phase Metrics
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74726059 - PHASE METRICS
- Serial number 74726059
- Registration number 2058724
- Filing date Sep 7, 1995
- Phase Metrics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74726060 - PHASE METRICS
- Serial number 74726060
- Registration number 2056767
- Filing date Sep 7, 1995
- Phase Metrics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Phase Metrics, Inc.

Organization

Patents Grantslast 30 patents

Apparatus and method for measuring flying height and a real index o...

Apparatus for measuring a small gap using a Savart plate

Loader with a matching finger that loads a head gimbal assembly ont...

Glass substrate inspection apparatus

Low z-height loader for a head gimbal assembly

Air bearing for a spindle

End effector for a robotic arm of a disk certifier

Piezoelectric nanopositioner

End effector for a robotic arm of a disk certifier

Method and apparatus for providing a clock assembly

Method and apparatus for detecting defects on a disk using interfer...

Apparatus and method for surface inspection by specular interferome...

Distortion of an isolated pulse

Crash tolerant air bearing spindle

Low noise preamplifier for a magneto-resistive head tester

Method and apparatus for the measurement of defects in magnetic rec...

Magnetic media tester which includes a filter that filters the prod...

Apparatus for testing multiple magnetic recording heads

Variable pneumatic loader for testing a disk drive head gimbal asse...

Non-contact optical glide tester

Thin film flying height calibration disk for calibrating flying hei...

Optically verified glide

Pressurized air-ionization ground for an air bearing spindle

Method and apparatus for combined glide and defect analysis

Combined interferometer/ellipsometer for measuring small spacings

Stops and a clutch for a loader that test the flying height of a di...

Conductive contact for an air bearing spindle

Determining the complex refractive index phase offset in interferom...

Surface inspection of a disk by diffraction pattern sampling

Combined interferometer/polarimeter

Trademarklast 30 trademarks

78034785 - PHOTONIC CERTIFICATION

78034782 - PHOTONIC CERTIFIER

75069170 - PARAGLIDE

74726059 - PHASE METRICS

74726060 - PHASE METRICS