PHICOM CO., LTD.

Organization

Bucheon-si, Gyeonggi-do, KR

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for manufacturing a probe card
- Patent number 8,117,740
- Issue date Feb 21, 2012
- Phicom Corporation
- Ki-Joon Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating cantilever type probe and method of fabricati...
- Patent number 8,114,302
- Issue date Feb 14, 2012
- Phicom Corporation
- Han-Moo Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe and method of making same
- Patent number 8,012,331
- Issue date Sep 6, 2011
- Phicom Corporation
- Oug-Ki Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a probe card
- Patent number 7,975,380
- Issue date Jul 12, 2011
- Phicom Corporation
- Oug-Ki Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of bonding probes and method of manufacturing a probe card u...
- Patent number 7,886,957
- Issue date Feb 15, 2011
- Phicom Corporation
- Ki-Joon Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Substrate of probe card and method for regenerating thereof
- Patent number 7,867,790
- Issue date Jan 11, 2011
- Phicom Corporation
- Jung-Sun Yoo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing semiconductor devices
- Patent number 7,859,280
- Issue date Dec 28, 2010
- Phicom Corporation
- Han-Moo Lee
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe and methods of fabricating and bonding the same
- Patent number 7,830,162
- Issue date Nov 9, 2010
- Phicom Corporation
- Oug-Ki Lee
- G01 - MEASURING TESTING
Information Patent Grant
Silicon wafer for probe bonding and probe bonding method using thereof
- Patent number 7,804,312
- Issue date Sep 28, 2010
- Phicom Corporation
- Jung-Hoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever-type probe and method of fabricating the same
- Patent number 7,678,587
- Issue date Mar 16, 2010
- Phicom Corporation
- Ki-Joon Kim
- G01 - MEASURING TESTING
Information Patent Grant
Vertical-type electric contactor and manufacture method thereof
- Patent number 7,675,305
- Issue date Mar 9, 2010
- Phicom Corporation
- Byoung-hak Song
- G01 - MEASURING TESTING
Information Patent Grant
Probe card manufacturing method including sensing probe and the pro...
- Patent number 7,602,204
- Issue date Oct 13, 2009
- Phicom Corporation
- Han-Moo Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe positioning and bonding device and probe bonding method
- Patent number 7,592,565
- Issue date Sep 22, 2009
- Phicom Corporation
- Oug-Ki Lee
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for manufacturing electrical contact element for testing ele...
- Patent number 7,579,855
- Issue date Aug 25, 2009
- PHICOM Corporation
- Oug-Ki Lee
- G01 - MEASURING TESTING
Information Patent Grant
Contact tip structure of a connecting element
- Patent number 7,511,524
- Issue date Mar 31, 2009
- Phicom Corporation
- Oug-Ki Lee
- G01 - MEASURING TESTING
Information Patent Grant
Interconnection device for a printed circuit board, a method of man...
- Patent number 7,503,811
- Issue date Mar 17, 2009
- Phicom Corporation
- Dongweon Seo
- G01 - MEASURING TESTING
Information Patent Grant
Bone vibrating speaker using the diaphragm and mobile phone thereby
- Patent number 7,466,833
- Issue date Dec 16, 2008
- Phicom Corporation
- Oug-Ki Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Interconnection device for a printed circuit board, a method of man...
- Patent number 7,452,248
- Issue date Nov 18, 2008
- Phicom Corporation
- Dongweon Seo
- G01 - MEASURING TESTING
Information Patent Grant
Subminiature bone vibrating speaker using the diaphragm and mobile...
- Patent number 7,319,773
- Issue date Jan 15, 2008
- Phicom Corporation
- Oug-Ki Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Interconnection device for a printed circuit board, a method of man...
- Patent number 7,306,493
- Issue date Dec 11, 2007
- Phicom Corporation
- Dongweon Seo
- G01 - MEASURING TESTING
Information Patent Grant
Probe and method of making same
- Patent number 7,285,966
- Issue date Oct 23, 2007
- Phicom Corporation
- Oug-Ki Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
JIG FOR MANUFACTURING PROBE CARD, PROBE ALIGNMENT SYSTEM COMPRISING...
- Publication number 20230176092
- Publication date Jun 8, 2023
- PHICOM CO., LTD.
- Oug Ki LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING AN INSPECTION APPARATUS FOR INSPECTING AN E...
- Publication number 20100242275
- Publication date Sep 30, 2010
- Phicom Corproation
- Woo-Chang Choi
- G01 - MEASURING TESTING
Information Patent Application
Space Transformer, Manufacturing Method of the Space Transformer an...
- Publication number 20090184727
- Publication date Jul 23, 2009
- PHICOM CORPORATION
- Ki-Joon Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ARRANGING A PLURALITY OF CONNECTING ELEMENTS
- Publication number 20090151159
- Publication date Jun 18, 2009
- PHICOM CORPORATION
- Oug-Ki LEE
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing electrical contact element for testing ele...
- Publication number 20060192581
- Publication date Aug 31, 2006
- Phicom Corporation
- Oug-Ki Lee
- G01 - MEASURING TESTING
Information Patent Application
Probe and method of making same
- Publication number 20060171425
- Publication date Aug 3, 2006
- PHICOM CORPORATION
- Oug-Ki Lee
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
75498948 - PHICOM
- Serial number 75498948
- Filing date Jun 8, 1998
- Phicom, Inc.
- 42 - Scientific and technological services and research and design relating thereto

PHICOM CO., LTD.

Organization

Patents Grantslast 30 patents

Method and apparatus for manufacturing a probe card

Method of fabricating cantilever type probe and method of fabricati...

Probe and method of making same

Method of fabricating a probe card

Method of bonding probes and method of manufacturing a probe card u...

Substrate of probe card and method for regenerating thereof

Probe card for testing semiconductor devices

Vertical probe and methods of fabricating and bonding the same

Silicon wafer for probe bonding and probe bonding method using thereof

Cantilever-type probe and method of fabricating the same

Vertical-type electric contactor and manufacture method thereof

Probe card manufacturing method including sensing probe and the pro...

Probe positioning and bonding device and probe bonding method

Method for manufacturing electrical contact element for testing ele...

Contact tip structure of a connecting element

Interconnection device for a printed circuit board, a method of man...

Bone vibrating speaker using the diaphragm and mobile phone thereby

Interconnection device for a printed circuit board, a method of man...

Subminiature bone vibrating speaker using the diaphragm and mobile...

Interconnection device for a printed circuit board, a method of man...

Probe and method of making same

Patents Applicationslast 30 patents

JIG FOR MANUFACTURING PROBE CARD, PROBE ALIGNMENT SYSTEM COMPRISING...

METHOD OF MANUFACTURING AN INSPECTION APPARATUS FOR INSPECTING AN E...

Space Transformer, Manufacturing Method of the Space Transformer an...

METHOD FOR ARRANGING A PLURALITY OF CONNECTING ELEMENTS

Method for manufacturing electrical contact element for testing ele...

Probe and method of making same

Trademarklast 30 trademarks

75498948 - PHICOM