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CHUNGCHEONGNAM-DO, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Probe head and probe card having same
Patent number
11,852,656
Issue date
Dec 26, 2023
POINT ENGINEERING CO., LTD.
Bum Mo Ahn
G01 - MEASURING TESTING
Information
Patent Grant
Anodic aluminum oxide structure, probe head having same, and probe...
Patent number
11,696,398
Issue date
Jul 4, 2023
POINT ENGINEERING CO., LTD.
Bum Mo Ahn
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Anodic aluminum oxide structure
Patent number
11,632,858
Issue date
Apr 18, 2023
POINT ENGINEERING CO., LTD.
Bum Mo Ahn
G01 - MEASURING TESTING
Information
Patent Grant
Probe head and probe card having same
Patent number
11,543,432
Issue date
Jan 3, 2023
POINT ENGINEERING CO., LTD.
Bum Mo Ahn
G01 - MEASURING TESTING
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