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NEW YORK, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for non-conductively interconnecting integrate...
- Patent number 6,728,113
- Issue date Apr 27, 2004
- Polychip, Inc.
- Thomas F. Knight
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for non-conductively interconnecting integrated circuits...
- Patent number 5,629,838
- Issue date May 13, 1997
- Polychip, Inc.
- Thomas F. Knight
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for non-conductively interconnecting integrate...
- Publication number 20050002448
- Publication date Jan 6, 2005
- Polychip
- Thomas F. Knight
- G01 - MEASURING TESTING

Trademarklast 30 trademarks