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PRO-2000 CO., LTD

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  • GYEONGGI-DO, KR
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe card for testing wafer
    • Patent number 11,630,129
    • Issue date Apr 18, 2023
    • PRO-2000 Co., LTD
    • Jun Soo Cho
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD FOR TESTING WAFER
    • Publication number 20220128602
    • Publication date Apr 28, 2022
    • PRO-2000 Co., LTD
    • Jun Soo CHO
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks