Probe Technology, Inc.

Organization

Santa Clara, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Assembly structure for making integrated circuit chip probe cards
- Patent number 6,204,674
- Issue date Mar 20, 2001
- Probe Technology, Inc.
- Krzysztof Dabrowiecki
- G01 - MEASURING TESTING
Information Patent Grant
High temperature probe card for testing integrated circuits
- Patent number 6,064,215
- Issue date May 16, 2000
- Probe Technology, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Assembly structure for making integrated circuit chip probe cards
- Patent number 5,884,395
- Issue date Mar 23, 1999
- Probe Technology
- Krzysztof Dabrowiecki
- G01 - MEASURING TESTING
Information Patent Grant
Dual contact probe assembly for testing integrated circuits
- Patent number 5,764,072
- Issue date Jun 9, 1998
- Probe Technology
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for aligning probes
- Patent number 5,751,157
- Issue date May 12, 1998
- Probe Technology
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Membrane for holding a probe tip in proper location
- Patent number 5,742,174
- Issue date Apr 21, 1998
- Probe Technology
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a probe preserving a uniform stress distribution...
- Patent number 5,720,098
- Issue date Feb 24, 1998
- Probe Technology
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit testing apparatus for equalizing a contact force...
- Patent number 5,644,249
- Issue date Jul 1, 1997
- Probe Technology
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Large scale protrusion membrane for semiconductor devices under tes...
- Patent number 5,422,574
- Issue date Jun 6, 1995
- Probe Technology Corporation
- January Kister
- G01 - MEASURING TESTING

Probe Technology, Inc.

Organization

Patents Grantslast 30 patents

Assembly structure for making integrated circuit chip probe cards

High temperature probe card for testing integrated circuits

Assembly structure for making integrated circuit chip probe cards

Dual contact probe assembly for testing integrated circuits

Method and apparatus for aligning probes

Membrane for holding a probe tip in proper location

Method for making a probe preserving a uniform stress distribution...

Method and circuit testing apparatus for equalizing a contact force...

Large scale protrusion membrane for semiconductor devices under tes...

Patents Applicationslast 30 patents

Trademarklast 30 trademarks