PROCESS DIAGNOSTICS, INC

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SUNNYVALE, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for enabling high resolution film thickness an...
- Patent number 6,900,900
- Issue date May 31, 2005
- Process Diagnostics, Inc.
- James A. McMillen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring dose and energy of ion implantat...
- Patent number 6,900,894
- Issue date May 31, 2005
- Process Diagnostics, Inc.
- James A. McMillen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for measuring dose and engery of ion implantat...
- Publication number 20020080356
- Publication date Jun 27, 2002
- Process Diagnostics, Inc.
- James A. McMillen
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enabling high resolution film thickness an...
- Publication number 20020057437
- Publication date May 16, 2002
- Process Diagnostics, Inc.
- James A. McMillen
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
74121445 - PROCESS DIAGNOSTICS INC.
- Serial number 74121445
- Filing date Dec 7, 1990
- Process Diagnostics Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments