PSIA Corporation

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Organization

Sungnam, KR

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope with improved probe head mount
- Patent number 6,951,129
- Issue date Oct 4, 2005
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with improved probe tip mount
- Patent number 6,945,100
- Issue date Sep 20, 2005
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with improved scan accuracy, scan speed,...
- Patent number 6,677,567
- Issue date Jan 13, 2004
- PSIA Corporation
- Jaewan Hong
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring mechanical and electrical charac...
- Patent number 6,185,991
- Issue date Feb 13, 2001
- PSIA Corporation
- Jaewan Hong
- B82 - NANO-TECHNOLOGY

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Patents Applicationslast 30 patents

Information Patent Application
Scanning probe microscope capable of measuring samples having overh...
- Publication number 20080078932
- Publication date Apr 3, 2008
- PSIA Co, LTD
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope for measuring angle and method of measuri...
- Publication number 20080073519
- Publication date Mar 27, 2008
- PSIA Co, LTD
- Hyun Seung Shin
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for and method of driving X-Y scanner in scanning probe m...
- Publication number 20070012874
- Publication date Jan 18, 2007
- PSIA Corporation
- Joonhui Kim
- G01 - MEASURING TESTING
Information Patent Application
Scanning capacitance microscope, method of driving the same, and re...
- Publication number 20070012093
- Publication date Jan 18, 2007
- PSIA Co, LTD
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope with improved probe tip mount
- Publication number 20040140424
- Publication date Jul 22, 2004
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope with improved probe head mount
- Publication number 20040140426
- Publication date Jul 22, 2004
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
77130080 - PARK SYSTEMS
- Serial number 77130080
- Registration number 3558196
- Filing date Mar 13, 2007
- PSIA, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments