QCEPT TECHNOLOGIES, INC

Organization

ATLANTA, GA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Patterned wafer inspection system using a non-vibrating contact pot...
- Patent number 8,275,564
- Issue date Sep 25, 2012
- Qcept Technologies, Inc.
- Mark A. Schulze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classification utilizing data from a non-vibrating contact p...
- Patent number 7,900,526
- Issue date Mar 8, 2011
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration of non-vibrating contact potential difference measureme...
- Patent number 7,752,000
- Issue date Jul 6, 2010
- Qcept Technologies, Inc.
- Mark A. Schulze
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Patent number 7,659,734
- Issue date Feb 9, 2010
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,634,365
- Issue date Dec 15, 2009
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection system
- Patent number 7,379,826
- Issue date May 27, 2008
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,337,076
- Issue date Feb 26, 2008
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 7,308,367
- Issue date Dec 11, 2007
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of motions of rotating shafts using non-vibrating conta...
- Patent number 7,152,476
- Issue date Dec 26, 2006
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,107,158
- Issue date Sep 12, 2006
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,103,482
- Issue date Sep 5, 2006
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection system
- Patent number 7,092,826
- Issue date Aug 15, 2006
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection system
- Patent number 6,957,154
- Issue date Oct 18, 2005
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
PATTERNED WAFER INSPECTION SYSTEM USING A NON-VIBRATING CONTACT POT...
- Publication number 20100198389
- Publication date Aug 5, 2010
- QCEPT TECHNOLOGIES, INC.
- Mark A. SCHULZE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Calibration of non-vibrating contact potential difference measureme...
- Publication number 20090276176
- Publication date Nov 5, 2009
- QCEPT TECHNOLOGIES, INC.
- Mark A. Schulze
- G01 - MEASURING TESTING
Information Patent Application
DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT P...
- Publication number 20090139312
- Publication date Jun 4, 2009
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Publication number 20080217530
- Publication date Sep 11, 2008
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND APPARATUS
- Publication number 20080162066
- Publication date Jul 3, 2008
- QCEPT TECHNOLOGIES, INC.
- M. Brandon STEELE
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and apparatus
- Publication number 20070010954
- Publication date Jan 11, 2007
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection system
- Publication number 20060276976
- Publication date Dec 7, 2006
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection system
- Publication number 20050234658
- Publication date Oct 20, 2005
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and apparatus
- Publication number 20050162178
- Publication date Jul 28, 2005
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Measurement of motions of rotating shafts using non-vibrating conta...
- Publication number 20050016279
- Publication date Jan 27, 2005
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system
- Publication number 20040241890
- Publication date Dec 2, 2004
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
86407411 - QCEPT 380GT
- Serial number 86407411
- Filing date Sep 26, 2014
- Qcept Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76613775 - QCEPT
- Serial number 76613775
- Registration number 3669660
- Filing date Sep 28, 2004
- Qcept Technologies Inc.
- 41 - Education
Information Trademark
76588252 - CHEMETRIQ
- Serial number 76588252
- Registration number 3118703
- Filing date Apr 22, 2004
- Qcept Technologies Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76465819 - QCEPT
- Serial number 76465819
- Filing date Nov 8, 2002
- Qcept Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

QCEPT TECHNOLOGIES, INC

Organization

Patents Grantslast 30 patents

Patterned wafer inspection system using a non-vibrating contact pot...

Defect classification utilizing data from a non-vibrating contact p...

Calibration of non-vibrating contact potential difference measureme...

Semiconductor inspection system and apparatus utilizing a non-vibra...

Inspection system and apparatus

Semiconductor wafer inspection system

Inspection system and apparatus

Wafer inspection system

Measurement of motions of rotating shafts using non-vibrating conta...

Inspection system and apparatus

Inspection system and apparatus

Semiconductor wafer inspection system

Semiconductor wafer inspection system

Patents Applicationslast 30 patents

PATTERNED WAFER INSPECTION SYSTEM USING A NON-VIBRATING CONTACT POT...

Calibration of non-vibrating contact potential difference measureme...

DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT P...

Semiconductor inspection system and apparatus utilizing a non-vibra...

INSPECTION SYSTEM AND APPARATUS

Inspection system and apparatus

Semiconductor wafer inspection system

Semiconductor wafer inspection system

Inspection system and apparatus

Measurement of motions of rotating shafts using non-vibrating conta...

Wafer inspection system

Trademarklast 30 trademarks

86407411 - QCEPT 380GT

76613775 - QCEPT

76588252 - CHEMETRIQ

76465819 - QCEPT