Qoniac GmbH

Organization

Dresden, DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for simulation of lithography overlay
- Patent number 11,366,397
- Issue date Jun 21, 2022
- Qoniac GmbH
- Boris Habets
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic apparatus and method of controlling a lithographic app...
- Patent number 11,181,830
- Issue date Nov 23, 2021
- Qoniac GmbH
- Stefan Buhl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer exposure method using wafer models and wafer fabrication asse...
- Patent number 11,092,901
- Issue date Aug 17, 2021
- Qoniac GmbH
- Stefan Buhl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process control method for lithographically processed semiconductor...
- Patent number 10,739,685
- Issue date Aug 11, 2020
- Qoniac GmbH
- Stefan Buhl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for fabricating wafer by calculating process c...
- Patent number 10,739,688
- Issue date Aug 11, 2020
- Qoniac GmbH
- Boris Habets
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for processing of a further layer on a semiconductor wafer
- Patent number 10,699,971
- Issue date Jun 30, 2020
- Qoniac GmbH
- Boris Habets
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for simulation of lithography overlay
- Patent number 10,379,447
- Issue date Aug 13, 2019
- Qoniac GmbH
- Boris Habets
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus of evaluating a semiconductor manufacturing pr...
- Patent number 10,310,490
- Issue date Jun 4, 2019
- Qoniac GmbH
- Stefan Buhl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for fabricating wafer by calculating process c...
- Patent number 10,295,914
- Issue date May 21, 2019
- Qoniac GmbH
- Boris Habets
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing semiconductor devices by using sampling plans
- Patent number 10,234,401
- Issue date Mar 19, 2019
- QONIAC GMBH
- Stefan Buhl
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for assessing the usability of an exposed and developed semi...
- Patent number 10,008,422
- Issue date Jun 26, 2018
- Qoniac GmbH
- Boris Habets
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for fabricating wafer by calculating process c...
- Patent number 9,543,223
- Issue date Jan 10, 2017
- Qoniac GmbH
- Boris Habets
- G05 - CONTROLLING REGULATING

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Patents Applicationslast 30 patents

Information Patent Application
Wafer Exposure Method Using Wafer Models and Wafer Fabrication Asse...
- Publication number 20210191272
- Publication date Jun 24, 2021
- Qoniac GmbH
- Stefan Buhl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHIC APPARATUS AND METHOD OF CONTROLLING A LITHOGRAPHIC APP...
- Publication number 20200209762
- Publication date Jul 2, 2020
- Qoniac GmbH
- Stefan Buhl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SIMULATION OF LITHOGRAPHY OVERLAY
- Publication number 20190361354
- Publication date Nov 28, 2019
- Qoniac GmbH
- Boris Habets
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Process Control Method For Lithographically Processed Semiconductor...
- Publication number 20190250516
- Publication date Aug 15, 2019
- Qoniac GmbH
- Stefan Buhl
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR ASSESSING THE USABILITY OF AN EXPOSED AND DEVELOPED SEMI...
- Publication number 20180342429
- Publication date Nov 29, 2018
- Qoniac GmbH
- Boris Habets
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES BY USING SAMPLING PLANS
- Publication number 20170242425
- Publication date Aug 24, 2017
- Qoniac GmbH
- Stefan Buhl
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and Apparatus of Evaluating a Semiconductor Manufacturing Pr...
- Publication number 20170221741
- Publication date Aug 3, 2017
- Qoniac GmbH
- Stefan Buhl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method And Apparatus For Analysis Of Processing Of A Semiconductor...
- Publication number 20170053842
- Publication date Feb 23, 2017
- Qoniac GmbH
- Martin Roessiger
- H01 - BASIC ELECTRIC ELEMENTS

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Trademarklast 30 trademarks

Information Trademark
85444116 - QONIAC
- Serial number 85444116
- Registration number 4359837
- Filing date Oct 11, 2011
- Qoniac GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Qoniac GmbH

Organization

Patents Grantslast 30 patents

Method and apparatus for simulation of lithography overlay

Lithographic apparatus and method of controlling a lithographic app...

Wafer exposure method using wafer models and wafer fabrication asse...

Process control method for lithographically processed semiconductor...

Method and apparatus for fabricating wafer by calculating process c...

Method for processing of a further layer on a semiconductor wafer

Method and apparatus for simulation of lithography overlay

Method and apparatus of evaluating a semiconductor manufacturing pr...

Method and apparatus for fabricating wafer by calculating process c...

Method of manufacturing semiconductor devices by using sampling plans

Method for assessing the usability of an exposed and developed semi...

Method and apparatus for fabricating wafer by calculating process c...

Patents Applicationslast 30 patents

Wafer Exposure Method Using Wafer Models and Wafer Fabrication Asse...

LITHOGRAPHIC APPARATUS AND METHOD OF CONTROLLING A LITHOGRAPHIC APP...

METHOD AND APPARATUS FOR SIMULATION OF LITHOGRAPHY OVERLAY

Process Control Method For Lithographically Processed Semiconductor...

METHOD FOR ASSESSING THE USABILITY OF AN EXPOSED AND DEVELOPED SEMI...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES BY USING SAMPLING PLANS

Method and Apparatus of Evaluating a Semiconductor Manufacturing Pr...

Method And Apparatus For Analysis Of Processing Of A Semiconductor...

Trademarklast 30 trademarks

85444116 - QONIAC