QUALITAU INC

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MOUNTAIN VIEW, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 11,175,309
- Issue date Nov 16, 2021
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
System and method for limiting voltage
- Patent number 11,054,444
- Issue date Jul 6, 2021
- QualiTau, Inc.
- James Borthwick
- G01 - MEASURING TESTING
Information Patent Grant
Universal probing assembly with five degrees of freedom
- Patent number 10,890,602
- Issue date Jan 12, 2021
- QualiTau, Inc.
- Mirtcha Lupashku
- G01 - MEASURING TESTING
Information Patent Grant
Signal distribution apparatus
- Patent number 10,690,715
- Issue date Jun 23, 2020
- Qualitau, Inc.
- James Borthwick
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed current source with internal impedance matching
- Patent number 9,772,351
- Issue date Sep 26, 2017
- Qualitau, Inc.
- Jens Ullmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wafer temperature measurement tool
- Patent number 9,196,516
- Issue date Nov 24, 2015
- Qualitau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Integrated unit for electrical/reliability testing with improved th...
- Patent number 7,888,951
- Issue date Feb 15, 2011
- Qualitau, Inc.
- Mirtcha Lupashku
- G01 - MEASURING TESTING
Information Patent Grant
Modified current source (MCS) with seamless range switching
- Patent number 7,812,589
- Issue date Oct 12, 2010
- Qualitau, Inc.
- James Borthwick
- G01 - MEASURING TESTING
Information Patent Grant
Electromigration tester for high capacity and high current
- Patent number 7,602,205
- Issue date Oct 13, 2009
- Qualitau, Inc.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Grant
High temperature ceramic socket configured to test packaged semicon...
- Patent number 7,602,201
- Issue date Oct 13, 2009
- Qualitau, Inc.
- Jose Ysaguirre
- G01 - MEASURING TESTING
Information Patent Grant
High temperature ceramic die package and DUT board socket
- Patent number 7,598,760
- Issue date Oct 6, 2009
- Qualitau, Inc.
- Thomas G. Bensing
- G01 - MEASURING TESTING
Information Patent Grant
Automatic multiplexing system for automated wafer testing
- Patent number 7,576,550
- Issue date Aug 18, 2009
- Qualitau, Inc.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic multiplexing system for automated semiconductor wafe...
- Patent number 7,511,517
- Issue date Mar 31, 2009
- Qualitau, Inc.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Grant
Voltage source measurement unit with minimized common mode errors
- Patent number 7,429,856
- Issue date Sep 30, 2008
- Qualitau, Inc.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connector for semiconductor device test fixture and test...
- Patent number 7,405,573
- Issue date Jul 29, 2008
- QualiTau, Inc.
- Peter P. Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
High temperature open ended zero insertion force (ZIF) test socket
- Patent number 7,172,450
- Issue date Feb 6, 2007
- QualiTau, Inc.
- Robert James Sylvia
- G01 - MEASURING TESTING
Information Patent Grant
Dual channel source measurement unit for semiconductor device testing
- Patent number 7,151,389
- Issue date Dec 19, 2006
- QualiTau, Inc.
- Tal Raichman
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card and air cooled probe head system
- Patent number 7,126,361
- Issue date Oct 24, 2006
- QualiTau, Inc.
- Michael L. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Automatic range finder for electric current testing
- Patent number 7,098,648
- Issue date Aug 29, 2006
- QualiTau, Inc.
- Gedaliahoo Krieger
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic discharge (ESD) tool for electronic device under test...
- Patent number 7,082,676
- Issue date Aug 1, 2006
- QualiTau, Inc.
- Adalberto M. Ramirez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed current generator circuit with charge booster
- Patent number 7,049,713
- Issue date May 23, 2006
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for packaged semiconductor devices
- Patent number 6,798,228
- Issue date Sep 28, 2004
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of electromigration in semiconductor integra...
- Patent number 6,784,000
- Issue date Aug 31, 2004
- QualiTau, Inc.
- Robert Sikora
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-temperature minimal (zero) insertion force socket
- Patent number 6,592,389
- Issue date Jul 15, 2003
- QualiTau, Inc.
- Peter Cuevas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ZIF socket and actuator for DIP
- Patent number 6,565,373
- Issue date May 20, 2003
- QualiTau, Inc.
- Peter Cuevas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable connector
- Patent number 6,469,494
- Issue date Oct 22, 2002
- Qualitau, Inc.
- Peter P. Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for pulsed reliability testing
- Patent number 6,249,137
- Issue date Jun 19, 2001
- Qualitau, Inc.
- Gedaliahoo Krieger
- G01 - MEASURING TESTING
Information Patent Grant
High temperature minimal (zero) insertion force socket
- Patent number 6,179,640
- Issue date Jan 30, 2001
- Qualitau, Inc.
- Robert Sikora
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three-dimensional programmable connector
- Patent number 6,150,829
- Issue date Nov 21, 2000
- Qualitau, Inc.
- Peter P. Cuevas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMI-AUTOMATIC PROBER
- Publication number 20210396785
- Publication date Dec 23, 2021
- QualiTau, Inc.
- Edward MCCLOUD
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL DISTRIBUTION APPARATUS
- Publication number 20180321300
- Publication date Nov 8, 2018
- QUALITAU, INC.
- James BORTHWICK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
UNIVERSAL PROBING ASSEMBLY WITH FIVE DEGREES OF FREEDOM
- Publication number 20180172731
- Publication date Jun 21, 2018
- QUALITAU, INC.
- Mirtcha LUPASHKU
- G01 - MEASURING TESTING
Information Patent Application
PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING
- Publication number 20170131327
- Publication date May 11, 2017
- QUALITAU, INC.
- Jens ULLMANN
- G01 - MEASURING TESTING
Information Patent Application
PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING
- Publication number 20170131326
- Publication date May 11, 2017
- QUALITAU, INC.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Application
SEMI-AUTOMATIC PROBER
- Publication number 20160187377
- Publication date Jun 30, 2016
- QUALITAU, INC.
- Edward MCCLOUD
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEMPERATURE MEASUREMENT TOOL
- Publication number 20140269822
- Publication date Sep 18, 2014
- QUALITAU, INC.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED UNIT FOR ELECTRICAL/RELIABILITY TESTING WITH IMPROVED TH...
- Publication number 20100201389
- Publication date Aug 12, 2010
- QUALITAU, INC.
- Mirtcha LUPASHKU
- G01 - MEASURING TESTING
Information Patent Application
MODIFIED CURRENT SOURCE (MCS) WITH SEAMLESS RANGE SWITCHING
- Publication number 20100052633
- Publication date Mar 4, 2010
- QUALITAU, INC.
- James BORTHWICK
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMIGRATION TESTER FOR HIGH CAPACITY AND HIGH CURRENT
- Publication number 20090206869
- Publication date Aug 20, 2009
- QUALITAU, INC.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE CERAMIC SOCKET CONFIGURED TO TEST PACKAGED SEMICON...
- Publication number 20080315900
- Publication date Dec 25, 2008
- QUALITAU, INC.
- Jose Ysaguirre
- G01 - MEASURING TESTING
Information Patent Application
SMART PARALLEL CONTROLLER FOR SEMICONDUCTOR EXPERIMENTS
- Publication number 20080315862
- Publication date Dec 25, 2008
- QUALITAU, INC.
- Shay-Tsion Daniel
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC MULTIPLEXING SYSTEM FOR AUTOMATED WAFER TESTING
- Publication number 20080238451
- Publication date Oct 2, 2008
- QUALITAU, INC.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Application
Semi-automatic multiplexing system for automated semiconductor wafe...
- Publication number 20070103176
- Publication date May 10, 2007
- QualiTau, Inc.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Application
Automatic range finder for electric current testing
- Publication number 20050206367
- Publication date Sep 22, 2005
- QualiTau, Inc.
- Gedaliahoo Krieger
- G01 - MEASURING TESTING
Information Patent Application
Dual channel source measurement unit for semiconductor device testing
- Publication number 20050194963
- Publication date Sep 8, 2005
- QualiTau, Inc.
- Tal Raichman
- G01 - MEASURING TESTING
Information Patent Application
Pulsed current generator circuit with charge booster
- Publication number 20050128655
- Publication date Jun 16, 2005
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic discharge (ESD) tool for electronic device under test...
- Publication number 20050028356
- Publication date Feb 10, 2005
- QualiTau Inc.
- Adalberto M. Ramirez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test socket for packaged semiconductor devices
- Publication number 20040135592
- Publication date Jul 15, 2004
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Application
ZIF Socket and actuator for DIP
- Publication number 20030003790
- Publication date Jan 2, 2003
- QualiTau, Inc.
- Peter Cuevas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-temperature minimal (zero) insertion force socket
- Publication number 20030003791
- Publication date Jan 2, 2003
- QualiTau, Inc.
- Peter Cuevas
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
74691283 - RES-Q
- Serial number 74691283
- Registration number 2159228
- Filing date Jun 20, 1995
- Qualitau, Inc.
- 42 - Scientific and technological services and research and design relating thereto

QUALITAU INC

Organization

Patents Grantslast 30 patents

Semi-automatic prober

Semi-automatic prober

System and method for limiting voltage

Universal probing assembly with five degrees of freedom

Signal distribution apparatus

Pulsed current source with internal impedance matching

Wafer temperature measurement tool

Integrated unit for electrical/reliability testing with improved th...

Modified current source (MCS) with seamless range switching

Electromigration tester for high capacity and high current

High temperature ceramic socket configured to test packaged semicon...

High temperature ceramic die package and DUT board socket

Automatic multiplexing system for automated wafer testing

Semi-automatic multiplexing system for automated semiconductor wafe...

Voltage source measurement unit with minimized common mode errors

Electrical connector for semiconductor device test fixture and test...

High temperature open ended zero insertion force (ZIF) test socket

Dual channel source measurement unit for semiconductor device testing

Vertical probe card and air cooled probe head system

Automatic range finder for electric current testing

Electrostatic discharge (ESD) tool for electronic device under test...

Pulsed current generator circuit with charge booster

Test socket for packaged semiconductor devices

Method for measurement of electromigration in semiconductor integra...

High-temperature minimal (zero) insertion force socket

ZIF socket and actuator for DIP

Programmable connector

Circuit and method for pulsed reliability testing

High temperature minimal (zero) insertion force socket

Three-dimensional programmable connector

Patents Applicationslast 30 patents

SEMI-AUTOMATIC PROBER

SIGNAL DISTRIBUTION APPARATUS

UNIVERSAL PROBING ASSEMBLY WITH FIVE DEGREES OF FREEDOM

PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING

PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING

SEMI-AUTOMATIC PROBER

WAFER TEMPERATURE MEASUREMENT TOOL

INTEGRATED UNIT FOR ELECTRICAL/RELIABILITY TESTING WITH IMPROVED TH...

MODIFIED CURRENT SOURCE (MCS) WITH SEAMLESS RANGE SWITCHING

ELECTROMIGRATION TESTER FOR HIGH CAPACITY AND HIGH CURRENT

HIGH TEMPERATURE CERAMIC SOCKET CONFIGURED TO TEST PACKAGED SEMICON...

SMART PARALLEL CONTROLLER FOR SEMICONDUCTOR EXPERIMENTS

AUTOMATIC MULTIPLEXING SYSTEM FOR AUTOMATED WAFER TESTING

Semi-automatic multiplexing system for automated semiconductor wafe...

Automatic range finder for electric current testing

Dual channel source measurement unit for semiconductor device testing

Pulsed current generator circuit with charge booster

Electrostatic discharge (ESD) tool for electronic device under test...

Test socket for packaged semiconductor devices

ZIF Socket and actuator for DIP

High-temperature minimal (zero) insertion force socket

Trademarklast 30 trademarks

74691283 - RES-Q