Membership
Tour
Register
Log in
QUALITAU INC
Follow
Organization
MOUNTAIN VIEW, CA, US
Organizations
Overview
Industries
People
People
Information
Transactions
Events
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Semi-automatic prober
Patent number
12,135,335
Issue date
Nov 5, 2024
QualiTau, Inc.
Edward McCloud
G01 - MEASURING TESTING
Information
Patent Grant
Semi-automatic prober
Patent number
11,175,309
Issue date
Nov 16, 2021
QualiTau, Inc.
Edward McCloud
G01 - MEASURING TESTING
Information
Patent Grant
System and method for limiting voltage
Patent number
11,054,444
Issue date
Jul 6, 2021
QualiTau, Inc.
James Borthwick
G01 - MEASURING TESTING
Information
Patent Grant
Universal probing assembly with five degrees of freedom
Patent number
10,890,602
Issue date
Jan 12, 2021
QualiTau, Inc.
Mirtcha Lupashku
G01 - MEASURING TESTING
Information
Patent Grant
Signal distribution apparatus
Patent number
10,690,715
Issue date
Jun 23, 2020
Qualitau, Inc.
James Borthwick
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed current source with internal impedance matching
Patent number
9,772,351
Issue date
Sep 26, 2017
Qualitau, Inc.
Jens Ullmann
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Wafer temperature measurement tool
Patent number
9,196,516
Issue date
Nov 24, 2015
Qualitau, Inc.
Edward McCloud
G01 - MEASURING TESTING
Information
Patent Grant
Integrated unit for electrical/reliability testing with improved th...
Patent number
7,888,951
Issue date
Feb 15, 2011
Qualitau, Inc.
Mirtcha Lupashku
G01 - MEASURING TESTING
Information
Patent Grant
Modified current source (MCS) with seamless range switching
Patent number
7,812,589
Issue date
Oct 12, 2010
Qualitau, Inc.
James Borthwick
G01 - MEASURING TESTING
Information
Patent Grant
Electromigration tester for high capacity and high current
Patent number
7,602,205
Issue date
Oct 13, 2009
Qualitau, Inc.
Jens Ullmann
G01 - MEASURING TESTING
Information
Patent Grant
High temperature ceramic socket configured to test packaged semicon...
Patent number
7,602,201
Issue date
Oct 13, 2009
Qualitau, Inc.
Jose Ysaguirre
G01 - MEASURING TESTING
Information
Patent Grant
High temperature ceramic die package and DUT board socket
Patent number
7,598,760
Issue date
Oct 6, 2009
Qualitau, Inc.
Thomas G. Bensing
G01 - MEASURING TESTING
Information
Patent Grant
Automatic multiplexing system for automated wafer testing
Patent number
7,576,550
Issue date
Aug 18, 2009
Qualitau, Inc.
Shahriar Mostarshed
G01 - MEASURING TESTING
Information
Patent Grant
Semi-automatic multiplexing system for automated semiconductor wafe...
Patent number
7,511,517
Issue date
Mar 31, 2009
Qualitau, Inc.
Shahriar Mostarshed
G01 - MEASURING TESTING
Information
Patent Grant
Voltage source measurement unit with minimized common mode errors
Patent number
7,429,856
Issue date
Sep 30, 2008
Qualitau, Inc.
Jens Ullmann
G01 - MEASURING TESTING
Information
Patent Grant
Electrical connector for semiconductor device test fixture and test...
Patent number
7,405,573
Issue date
Jul 29, 2008
QualiTau, Inc.
Peter P. Cuevas
G01 - MEASURING TESTING
Information
Patent Grant
High temperature open ended zero insertion force (ZIF) test socket
Patent number
7,172,450
Issue date
Feb 6, 2007
QualiTau, Inc.
Robert James Sylvia
G01 - MEASURING TESTING
Information
Patent Grant
Dual channel source measurement unit for semiconductor device testing
Patent number
7,151,389
Issue date
Dec 19, 2006
QualiTau, Inc.
Tal Raichman
G01 - MEASURING TESTING
Information
Patent Grant
Vertical probe card and air cooled probe head system
Patent number
7,126,361
Issue date
Oct 24, 2006
QualiTau, Inc.
Michael L. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Automatic range finder for electric current testing
Patent number
7,098,648
Issue date
Aug 29, 2006
QualiTau, Inc.
Gedaliahoo Krieger
G01 - MEASURING TESTING
Information
Patent Grant
Electrostatic discharge (ESD) tool for electronic device under test...
Patent number
7,082,676
Issue date
Aug 1, 2006
QualiTau, Inc.
Adalberto M. Ramirez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pulsed current generator circuit with charge booster
Patent number
7,049,713
Issue date
May 23, 2006
QualiTau, Inc.
Peter Cuevas
G01 - MEASURING TESTING
Information
Patent Grant
Test socket for packaged semiconductor devices
Patent number
6,798,228
Issue date
Sep 28, 2004
QualiTau, Inc.
Peter Cuevas
G01 - MEASURING TESTING
Information
Patent Grant
Method for measurement of electromigration in semiconductor integra...
Patent number
6,784,000
Issue date
Aug 31, 2004
QualiTau, Inc.
Robert Sikora
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-temperature minimal (zero) insertion force socket
Patent number
6,592,389
Issue date
Jul 15, 2003
QualiTau, Inc.
Peter Cuevas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
ZIF socket and actuator for DIP
Patent number
6,565,373
Issue date
May 20, 2003
QualiTau, Inc.
Peter Cuevas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Programmable connector
Patent number
6,469,494
Issue date
Oct 22, 2002
Qualitau, Inc.
Peter P. Cuevas
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for pulsed reliability testing
Patent number
6,249,137
Issue date
Jun 19, 2001
Qualitau, Inc.
Gedaliahoo Krieger
G01 - MEASURING TESTING
Information
Patent Grant
High temperature minimal (zero) insertion force socket
Patent number
6,179,640
Issue date
Jan 30, 2001
Qualitau, Inc.
Robert Sikora
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Three-dimensional programmable connector
Patent number
6,150,829
Issue date
Nov 21, 2000
Qualitau, Inc.
Peter P. Cuevas
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMI-AUTOMATIC PROBER
Publication number
20210396785
Publication date
Dec 23, 2021
QualiTau, Inc.
Edward MCCLOUD
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL DISTRIBUTION APPARATUS
Publication number
20180321300
Publication date
Nov 8, 2018
QUALITAU, INC.
James BORTHWICK
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
UNIVERSAL PROBING ASSEMBLY WITH FIVE DEGREES OF FREEDOM
Publication number
20180172731
Publication date
Jun 21, 2018
QUALITAU, INC.
Mirtcha LUPASHKU
G01 - MEASURING TESTING
Information
Patent Application
PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING
Publication number
20170131327
Publication date
May 11, 2017
QUALITAU, INC.
Jens ULLMANN
G01 - MEASURING TESTING
Information
Patent Application
PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING
Publication number
20170131326
Publication date
May 11, 2017
QUALITAU, INC.
Jens Ullmann
G01 - MEASURING TESTING
Information
Patent Application
SEMI-AUTOMATIC PROBER
Publication number
20160187377
Publication date
Jun 30, 2016
QUALITAU, INC.
Edward MCCLOUD
G01 - MEASURING TESTING
Information
Patent Application
WAFER TEMPERATURE MEASUREMENT TOOL
Publication number
20140269822
Publication date
Sep 18, 2014
QUALITAU, INC.
Edward McCloud
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED UNIT FOR ELECTRICAL/RELIABILITY TESTING WITH IMPROVED TH...
Publication number
20100201389
Publication date
Aug 12, 2010
QUALITAU, INC.
Mirtcha LUPASHKU
G01 - MEASURING TESTING
Information
Patent Application
MODIFIED CURRENT SOURCE (MCS) WITH SEAMLESS RANGE SWITCHING
Publication number
20100052633
Publication date
Mar 4, 2010
QUALITAU, INC.
James BORTHWICK
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMIGRATION TESTER FOR HIGH CAPACITY AND HIGH CURRENT
Publication number
20090206869
Publication date
Aug 20, 2009
QUALITAU, INC.
Jens Ullmann
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE CERAMIC SOCKET CONFIGURED TO TEST PACKAGED SEMICON...
Publication number
20080315900
Publication date
Dec 25, 2008
QUALITAU, INC.
Jose Ysaguirre
G01 - MEASURING TESTING
Information
Patent Application
SMART PARALLEL CONTROLLER FOR SEMICONDUCTOR EXPERIMENTS
Publication number
20080315862
Publication date
Dec 25, 2008
QUALITAU, INC.
Shay-Tsion Daniel
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC MULTIPLEXING SYSTEM FOR AUTOMATED WAFER TESTING
Publication number
20080238451
Publication date
Oct 2, 2008
QUALITAU, INC.
Shahriar Mostarshed
G01 - MEASURING TESTING
Information
Patent Application
Semi-automatic multiplexing system for automated semiconductor wafe...
Publication number
20070103176
Publication date
May 10, 2007
QualiTau, Inc.
Shahriar Mostarshed
G01 - MEASURING TESTING
Information
Patent Application
Automatic range finder for electric current testing
Publication number
20050206367
Publication date
Sep 22, 2005
QualiTau, Inc.
Gedaliahoo Krieger
G01 - MEASURING TESTING
Information
Patent Application
Dual channel source measurement unit for semiconductor device testing
Publication number
20050194963
Publication date
Sep 8, 2005
QualiTau, Inc.
Tal Raichman
G01 - MEASURING TESTING
Information
Patent Application
Pulsed current generator circuit with charge booster
Publication number
20050128655
Publication date
Jun 16, 2005
QualiTau, Inc.
Peter Cuevas
G01 - MEASURING TESTING
Information
Patent Application
Electrostatic discharge (ESD) tool for electronic device under test...
Publication number
20050028356
Publication date
Feb 10, 2005
QualiTau Inc.
Adalberto M. Ramirez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Test socket for packaged semiconductor devices
Publication number
20040135592
Publication date
Jul 15, 2004
QualiTau, Inc.
Peter Cuevas
G01 - MEASURING TESTING
Information
Patent Application
ZIF Socket and actuator for DIP
Publication number
20030003790
Publication date
Jan 2, 2003
QualiTau, Inc.
Peter Cuevas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High-temperature minimal (zero) insertion force socket
Publication number
20030003791
Publication date
Jan 2, 2003
QualiTau, Inc.
Peter Cuevas
H01 - BASIC ELECTRIC ELEMENTS
Trademark
last 30 trademarks
Information
Trademark
74691283 - RES-Q
Serial number
74691283
Registration number
2159228
Filing date
Jun 20, 1995
Qualitau, Inc.
42 - Scientific and technological services and research and design relating thereto