RAD-X-Ltd.

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Syracuse, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring the size distribution of particles
- Patent number 5,026,994
- Issue date Jun 25, 1991
- RAD-X-Ltd.
- Daniel R. Westcott
- G01 - MEASURING TESTING
Information Patent Grant
Radon progeny detector
- Patent number 4,963,730
- Issue date Oct 16, 1990
- RAD-X-Ltd.
- William C. Tetley
- G01 - MEASURING TESTING
Information Patent Grant
Radon progeny detector for measuring attached and unattached fractions
- Patent number 4,847,503
- Issue date Jul 11, 1989
- RAD-X-Ltd.
- William C. Tetley
- G01 - MEASURING TESTING