RAJA TECHNOLOGIES INC

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NORTH YORK, ON, CA

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Patents Grantslast 30 patents

Information Patent Grant
System and method of semiconductor characterization
- Patent number 10,564,215
- Issue date Feb 18, 2020
- Raja Technologies Inc.
- Ramesh Rajaduray
- G01 - MEASURING TESTING
Information Patent Grant
System and method of semiconductor characterization
- Patent number 10,352,989
- Issue date Jul 16, 2019
- Raja Technologies Inc.
- Ramesh Rajaduray
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF SEMICONDUCTOR CHARACTERIZATION
- Publication number 20190324077
- Publication date Oct 24, 2019
- Raja Technologies Inc.
- Ramesh Rajaduray
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
87032946
- Serial number 87032946
- Registration number 5104970
- Filing date May 11, 2016
- Raja Technologies Inc.
- 45 - Legal services