Raymax Technology, Inc.

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Agoura Hills, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Removable probe sensor assembly and scanning probe microscope
- Patent number 6,910,368
- Issue date Jun 28, 2005
- Raymax Technology, Inc.
- David J Ray
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope system including removable probe sensor a...
- Patent number 6,138,503
- Issue date Oct 31, 2000
- Raymax Technology, Inc.
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope with removable probe illuminator assembly
- Patent number 5,874,669
- Issue date Feb 23, 1999
- Raymax Technology, Inc.
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope
- Patent number 5,861,550
- Issue date Jan 19, 1999
- RayMax Technology, Incorporated
- David J. Ray
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

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