Real Time Metrology, Inc.

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Castro Valley, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical method and apparatus for inspecting large area planar objects
- Patent number 6,809,809
- Issue date Oct 26, 2004
- Real Time Metrology, Inc.
- Patrick D. Kinney
- G01 - MEASURING TESTING
Information Patent Grant
Optical method and apparatus for inspecting large area planar objects
- Patent number 6,630,996
- Issue date Oct 7, 2003
- Real Time Metrology, Inc.
- Nagaraja P. Rao
- G01 - MEASURING TESTING