REVERA INCORPORATED

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SANTA CLARA, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Silicon germanium thickness and composition determination using com...
- Patent number 9,594,035
- Issue date Mar 14, 2017
- ReVera, Incorporated
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measuring periodic structures using multi-a...
- Patent number 9,588,066
- Issue date Mar 7, 2017
- ReVera, Incorporated
- Heath A. Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for fabricating platelets of a monochromator fo...
- Patent number 9,297,771
- Issue date Mar 29, 2016
- ReVera, Incorporated
- Jeffrey T. Fanton
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for characterizing a film by X-ray photoelectron...
- Patent number 9,240,254
- Issue date Jan 19, 2016
- Revera, Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 9,201,030
- Issue date Dec 1, 2015
- ReVera, Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 8,610,059
- Issue date Dec 17, 2013
- Revera, Incorporated
- Paola deCecco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 8,269,167
- Issue date Sep 18, 2012
- Revera, Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calibrating an X-ray photoelectron spectrosco...
- Patent number 8,011,830
- Issue date Sep 6, 2011
- Revera Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate processing method and apparatus
- Patent number 7,996,178
- Issue date Aug 9, 2011
- Revera, Incorporated
- Alger C. Pike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 7,884,321
- Issue date Feb 8, 2011
- Revera, Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate processing method and apparatus
- Patent number 7,720,631
- Issue date May 18, 2010
- Revera, Incorporated
- Alger C. Pike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device incorporating a multilayered capacitor formed on...
- Patent number 7,561,438
- Issue date Jul 14, 2009
- ReVera Incorporated
- Yungman Liu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Calibrating multiple photoelectron spectroscopy systems
- Patent number 7,456,399
- Issue date Nov 25, 2008
- ReVera Incorporated
- Eric J. Soderstrom
- G01 - MEASURING TESTING
Information Patent Grant
System and method for depth profiling and characterization of thin...
- Patent number 7,449,682
- Issue date Nov 11, 2008
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Determining layer thickness using photoelectron spectroscopy
- Patent number 7,420,163
- Issue date Sep 2, 2008
- ReVera Incorporated
- Bruno Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 7,411,188
- Issue date Aug 12, 2008
- ReVera Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectron spectroscopy apparatus and method of use
- Patent number 7,399,963
- Issue date Jul 15, 2008
- ReVera Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Diamond anode
- Patent number 7,359,487
- Issue date Apr 15, 2008
- ReVera Incorporated
- Bruce Newcome
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for analyzing data generated by instruments
- Patent number 7,231,324
- Issue date Jun 12, 2007
- ReVera Incorporated
- James Orrock
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive characterization of thin films based on acquired spe...
- Patent number 6,891,158
- Issue date May 10, 2005
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive characterization of thin films using measured basis...
- Patent number 6,800,852
- Issue date Oct 5, 2004
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20180025897
- Publication date Jan 25, 2018
- ReVera, Incorporated
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
Feed-Forward of Multi-Layer and Multi-Process Information using XPS...
- Publication number 20170160081
- Publication date Jun 8, 2017
- ReVera, Incorporated
- Heath A. Pois
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
88680121 - REVERA
- Serial number 88680121
- Registration number 6068985
- Filing date Nov 5, 2019
- Revera Inc.
- 35 - Advertising
Information Trademark
88680105 - REVERA
- Serial number 88680105
- Filing date Nov 5, 2019
- Revera Inc.
- 35 - Advertising
Information Trademark
88680124
- Serial number 88680124
- Filing date Nov 5, 2019
- Revera Inc.
- 35 - Advertising
Information Trademark
88680108 - REVERA
- Serial number 88680108
- Registration number 6074197
- Filing date Nov 5, 2019
- REVERA INC.
- 35 - Advertising
Information Trademark
88680128
- Serial number 88680128
- Registration number 6074199
- Filing date Nov 5, 2019
- REVERA INC.
- 35 - Advertising
Information Trademark
88680114 - REVERA
- Serial number 88680114
- Filing date Nov 5, 2019
- Revera Inc.
- 35 - Advertising
Information Trademark
86731153 - AGEISM IS GETTING OLD
- Serial number 86731153
- Filing date Aug 20, 2015
- Revera Inc.
- 35 - Advertising
Information Trademark
85769773 - AGE IS MORE
- Serial number 85769773
- Registration number 4696391
- Filing date Nov 2, 2012
- Revera Inc.
- 16 - Paper, cardboard and goods made from these materials, not included in other classes
Information Trademark
85515290 - REVERA LIVING
- Serial number 85515290
- Registration number 4281702
- Filing date Jan 12, 2012
- Revera, Inc.
- 35 - Advertising
Information Trademark
85404970 - REVERALICIOUS
- Serial number 85404970
- Registration number 4457265
- Filing date Aug 23, 2011
- Revera Inc.
- 43 - Services for providing food and drink
Information Trademark
77731434 - REV IT UP
- Serial number 77731434
- Filing date May 7, 2009
- Revera Inc.
- 43 - Services for providing food and drink
Information Trademark
77184472
- Serial number 77184472
- Registration number 3864760
- Filing date May 18, 2007
- Retirement Residences Real Estate Investment Trust
- 41 - Education
Information Trademark
77184885 - ENHANCING LIVES
- Serial number 77184885
- Registration number 3637278
- Filing date May 18, 2007
- Retirement Residences Real Estate Investment Trust
- 35 - Advertising
Information Trademark
77976664 - ENHANCING LIVES
- Serial number 77976664
- Registration number 3705318
- Filing date May 18, 2007
- Retirement Residences Real Estate Investment Trust
- 41 - Education
Information Trademark
77184518 - REVERA
- Serial number 77184518
- Registration number 3864761
- Filing date May 18, 2007
- Retirement Residences Real Estate Investment Trust
- 41 - Education
Information Trademark
77184813 - REVERA
- Serial number 77184813
- Registration number 3894182
- Filing date May 18, 2007
- Retirement Residences Real Estate Investment Trust
- 41 - Education
Information Trademark
78762824 - VERAFLEX
- Serial number 78762824
- Registration number 3299597
- Filing date Nov 29, 2005
- ReVera Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78332899 - REVERA
- Serial number 78332899
- Registration number 2966558
- Filing date Nov 25, 2003
- ReVera Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78332936 - PVX
- Serial number 78332936
- Filing date Nov 25, 2003
- ReVera Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78332929 - REVERA
- Serial number 78332929
- Registration number 2966561
- Filing date Nov 25, 2003
- ReVera Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78332907 - RVX
- Serial number 78332907
- Registration number 2966559
- Filing date Nov 25, 2003
- ReVera Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

REVERA INCORPORATED

Organization

Patents Grantslast 30 patents

Silicon germanium thickness and composition determination using com...

Methods and systems for measuring periodic structures using multi-a...

Methods and systems for fabricating platelets of a monochromator fo...

System and method for characterizing a film by X-ray photoelectron...

Method and system for non-destructive distribution profiling of an...

Method and system for non-destructive distribution profiling of an...

Method and system for non-destructive distribution profiling of an...

Method and system for calibrating an X-ray photoelectron spectrosco...

Semiconductor substrate processing method and apparatus

Method and system for non-destructive distribution profiling of an...

Semiconductor substrate processing method and apparatus

Electronic device incorporating a multilayered capacitor formed on...

Calibrating multiple photoelectron spectroscopy systems

System and method for depth profiling and characterization of thin...

Determining layer thickness using photoelectron spectroscopy

Method and system for non-destructive distribution profiling of an...

Photoelectron spectroscopy apparatus and method of use

Diamond anode

Techniques for analyzing data generated by instruments

Nondestructive characterization of thin films based on acquired spe...

Nondestructive characterization of thin films using measured basis...

Patents Applicationslast 30 patents

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

Feed-Forward of Multi-Layer and Multi-Process Information using XPS...

Trademarklast 30 trademarks

88680121 - REVERA

88680105 - REVERA

88680124

88680108 - REVERA

88680128

88680114 - REVERA

86731153 - AGEISM IS GETTING OLD

85769773 - AGE IS MORE

85515290 - REVERA LIVING

85404970 - REVERALICIOUS

77731434 - REV IT UP

77184472

77184885 - ENHANCING LIVES

77976664 - ENHANCING LIVES

77184518 - REVERA

77184813 - REVERA

78762824 - VERAFLEX

78332899 - REVERA

78332936 - PVX

78332929 - REVERA

78332907 - RVX