RIGAKU INDUSTRIAL CORPORATION

Organization

Takatsuki-shi, Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 7,949,093
- Issue date May 24, 2011
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Magnesium silicide-based multilayer x-ray fluorescence analyzers
- Patent number 7,848,483
- Issue date Dec 7, 2010
- Rigaku Innovative Technologies
- Yuriy Y. Platonov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray fluorescence spectrometer and program for use therewith
- Patent number 7,450,685
- Issue date Nov 11, 2008
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 7,356,114
- Issue date Apr 8, 2008
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and program used therein
- Patent number 7,187,751
- Issue date Mar 6, 2007
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Sample retainer for x-ray fluorescence analysis, x-ray fluorescence...
- Patent number 7,016,463
- Issue date Mar 21, 2006
- Rigaku Industrial Corporation
- Takao Moriyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometric system and a program for use therein
- Patent number 6,937,691
- Issue date Aug 30, 2005
- Rigaku Industrial Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer film spectroscopic element for boron fluorescene X-ray...
- Patent number 6,836,533
- Issue date Dec 28, 2004
- Rigaku Industrial Corporation
- Kazuaki Shimizu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High-energy beam irradiating desulfurization device
- Patent number 6,824,746
- Issue date Nov 30, 2004
- Rigaku Industrial Corporation
- Yasuhiro Ayukawa
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Grant
Sample preprocessing system for a fluorescent X-ray analysis and X-...
- Patent number 6,735,276
- Issue date May 11, 2004
- Rigaku Industrial Corporation
- Akihiro Ikeshita
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus
- Patent number 6,708,121
- Issue date Mar 16, 2004
- Rigaku Industrial Corporation
- Akira Arake
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 6,700,951
- Issue date Mar 2, 2004
- Rigaku Industrial Corporation
- Koushi Sumii
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 6,668,038
- Issue date Dec 23, 2003
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 6,647,090
- Issue date Nov 11, 2003
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analysis and apparatus therefor
- Patent number 6,611,577
- Issue date Aug 26, 2003
- Rigaku Industrial Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer system having sample exchanger
- Patent number 6,457,862
- Issue date Oct 1, 2002
- Rigaku Industrial Corporation
- Koushi Sumii
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzing apparatus
- Patent number 6,438,200
- Issue date Aug 20, 2002
- Rigaku Industrial Corporation
- Hiroaki Kita
- G01 - MEASURING TESTING
Information Patent Grant
Continuously scanning X-ray analyzer having improved readiness and...
- Patent number 6,404,847
- Issue date Jun 11, 2002
- Rigaku Industrial Corporation
- Bunjiro Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer
- Patent number 6,337,897
- Issue date Jan 8, 2002
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer useable as wavelength dispersive type an...
- Patent number 6,292,532
- Issue date Sep 18, 2001
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer with path switching device
- Patent number 6,240,159
- Issue date May 29, 2001
- Rigaku Industrial Corporation
- Hisayuki Kohno
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzing apparatus with enhanced radiation intensity
- Patent number 6,028,911
- Issue date Feb 22, 2000
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzing apparatus
- Patent number 5,732,120
- Issue date Mar 24, 1998
- Rigaku Industrial Corporation
- Takashi Shoji
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for the quantitative measurement of paint c...
- Patent number 5,579,362
- Issue date Nov 26, 1996
- Rigaku Industrial Corp.
- Naoki Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 5,406,609
- Issue date Apr 11, 1995
- Rigaku Industrial Corporation
- Tomoya Arai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray spectroscopic analyzing apparatus
- Patent number 5,132,997
- Issue date Jul 21, 1992
- Rigaku Industrial Corporation
- Shinjiro Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic X-ray detecting device
- Patent number 5,103,470
- Issue date Apr 7, 1992
- Rigaku Industrial Corp.
- Kanemasa Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzing method of solution specimen and specime...
- Patent number 4,788,700
- Issue date Nov 29, 1988
- Rigaku Industrial Corporation
- Shigetoshi Kurozumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscope
- Patent number 4,271,353
- Issue date Jun 2, 1981
- Rigaku Industrial Corporation
- Nobuo Ohtsuki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscope
- Patent number 4,256,961
- Issue date Mar 17, 1981
- Rigaku Industrial Corporation
- Takashi Shoji
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20090116613
- Publication date May 7, 2009
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN
- Publication number 20090041184
- Publication date Feb 12, 2009
- RIGAKU INDUSTRIAL CORPORATION
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer and program for use therewith
- Publication number 20070086567
- Publication date Apr 19, 2007
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20070058776
- Publication date Mar 15, 2007
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN
- Publication number 20060274882
- Publication date Dec 7, 2006
- RIGAKU INDUSTRIAL CORPORATION
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescense spectrometer
- Publication number 20030118148
- Publication date Jun 26, 2003
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
77283130 - EDXL
- Serial number 77283130
- Filing date Sep 19, 2007
- RIGAKU INDUSTRIAL CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77256908 - SUPERMINI
- Serial number 77256908
- Registration number 3525293
- Filing date Aug 16, 2007
- RIGAKU INDUSTRIAL CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78946296 - NANOHUNTER
- Serial number 78946296
- Registration number 3358044
- Filing date Aug 7, 2006
- RIGAKU INDUSTRIAL CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78707461 - PRIMUSTAR
- Serial number 78707461
- Filing date Sep 6, 2005
- RIGAKU INDUSTRIAL CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78707457 - PRIMINI
- Serial number 78707457
- Registration number 3188358
- Filing date Sep 6, 2005
- RIGAKU INDUSTRIAL CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76587544 - ULTRA CARRY
- Serial number 76587544
- Registration number 2998822
- Filing date Apr 20, 2004
- RIGAKU INDUSTRIAL CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75639390 - ZSX
- Serial number 75639390
- Registration number 2444964
- Filing date Feb 5, 1999
- RIGAKU INDUSTRIAL CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

RIGAKU INDUSTRIAL CORPORATION

Organization

Patents Grantslast 30 patents

X-ray fluorescence spectrometer

Magnesium silicide-based multilayer x-ray fluorescence analyzers

X-ray fluorescence spectrometer and program for use therewith

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer and program used therein

Sample retainer for x-ray fluorescence analysis, x-ray fluorescence...

X-ray fluorescence spectrometric system and a program for use therein

Multi-layer film spectroscopic element for boron fluorescene X-ray...

High-energy beam irradiating desulfurization device

Sample preprocessing system for a fluorescent X-ray analysis and X-...

Analyzing apparatus

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer

X-ray fluorescence analysis and apparatus therefor

Analyzer system having sample exchanger

X-ray fluorescence analyzing apparatus

Continuously scanning X-ray analyzer having improved readiness and...

Fluorescent X-ray analyzer

Fluorescent X-ray analyzer useable as wavelength dispersive type an...

Fluorescent X-ray analyzer with path switching device

X-ray analyzing apparatus with enhanced radiation intensity

Fluorescent X-ray analyzing apparatus

Method of and apparatus for the quantitative measurement of paint c...

X-ray analysis apparatus

X-ray spectroscopic analyzing apparatus

Characteristic X-ray detecting device

Fluorescent X-ray analyzing method of solution specimen and specime...

X-ray spectroscope

X-ray spectroscope

Patents Applicationslast 30 patents

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN

X-ray fluorescence spectrometer and program for use therewith

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN

X-ray fluorescense spectrometer

Trademarklast 30 trademarks

77283130 - EDXL

77256908 - SUPERMINI

78946296 - NANOHUNTER

78707461 - PRIMUSTAR

78707457 - PRIMINI

76587544 - ULTRA CARRY

75639390 - ZSX