S-I SEIKO Co, Ltd.

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Matsuyama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting materials
- Patent number 7,352,449
- Issue date Apr 1, 2008
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting scattered material by terahertz...
- Patent number 7,291,838
- Issue date Nov 6, 2007
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for detecting materials
- Publication number 20050116170
- Publication date Jun 2, 2005
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING