Saimeite Technology Co., Ltd.

Organization

Jiangsu, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for testing wafer, electronic device and storage...
- Patent number 12,181,511
- Issue date Dec 31, 2024
- Saimeite Technology Co., Ltd.
- Lincheng Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETERMINING PRODUCT MANUFACTURING PROGRAM,...
- Publication number 20230305527
- Publication date Sep 28, 2023
- Saimeite Technology Co., Ltd.
- Gangjiang LI
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND DEVICE FOR TESTING WAFER, ELECTRONIC DEVICE AND STORAGE...
- Publication number 20230213573
- Publication date Jul 6, 2023
- Saimeite Technology Co., Ltd.
- Lincheng HAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR TESTING PRODUCT, COMPUTER DEVICE AND READABLE...
- Publication number 20230213911
- Publication date Jul 6, 2023
- Saimeite Technology Co., Ltd.
- Liang FENG
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD, APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM FOR DETERM...
- Publication number 20230206423
- Publication date Jun 29, 2023
- Saimeite Technology Co., Ltd.
- Gangjiang LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MANAGING CHIP MANUFACTURING EQUIPMENT, APPARATUS, ELECTR...
- Publication number 20230207400
- Publication date Jun 29, 2023
- Saimeite Technology Co, Ltd.
- Wang SHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER CHIP TESTING METHOD AND APPARATUS, ELECTRONIC DEVICE AND STOR...
- Publication number 20230204664
- Publication date Jun 29, 2023
- Saimeite Technology Co., Ltd.
- Gangjiang LI
- G01 - MEASURING TESTING

Saimeite Technology Co., Ltd.

Organization

Patents Grantslast 30 patents

Method and device for testing wafer, electronic device and storage...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR DETERMINING PRODUCT MANUFACTURING PROGRAM,...

METHOD AND DEVICE FOR TESTING WAFER, ELECTRONIC DEVICE AND STORAGE...

METHOD AND DEVICE FOR TESTING PRODUCT, COMPUTER DEVICE AND READABLE...

METHOD, APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM FOR DETERM...

METHOD FOR MANAGING CHIP MANUFACTURING EQUIPMENT, APPARATUS, ELECTR...

WAFER CHIP TESTING METHOD AND APPARATUS, ELECTRONIC DEVICE AND STOR...

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