Scan Technology Co., Ltd.

Organization

Warabi, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Inspecting apparatus and method for foreign matter
- Patent number 7,342,655
- Issue date Mar 11, 2008
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus for foreign matter and inspecting mechanism th...
- Patent number 6,914,672
- Issue date Jul 5, 2005
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and apparatus for foreign matter
- Patent number 6,911,653
- Issue date Jun 28, 2005
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus for foreign matter
- Patent number 6,825,925
- Issue date Nov 30, 2004
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Integrated soft bag inspection system
- Patent number 6,504,606
- Issue date Jan 7, 2003
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Code recognition method and system for rotating body
- Patent number 6,089,455
- Issue date Jul 18, 2000
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign matter detecting system
- Patent number 6,081,324
- Issue date Jun 27, 2000
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Control method for factory automation system
- Patent number 6,038,486
- Issue date Mar 14, 2000
- Scan Technology Co., Ltd.
- Hiroyuki Saitoh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Print inspection method, print inspection apparatus and automatic p...
- Patent number 4,872,024
- Issue date Oct 3, 1989
- Sapporo Breweries, Ltd.
- Teiji Nagai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Inspecting apparatus and method for foreign matter
- Publication number 20060244959
- Publication date Nov 2, 2006
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Inspecting apparatus for foreign matter
- Publication number 20030214649
- Publication date Nov 20, 2003
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Inspecting apparatus for foreign matter and inspecting mechanism th...
- Publication number 20030210397
- Publication date Nov 13, 2003
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Inspecting method and apparatus for foreign matter
- Publication number 20030201384
- Publication date Oct 30, 2003
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING

Scan Technology Co., Ltd.

Organization

Patents Grantslast 30 patents

Inspecting apparatus and method for foreign matter

Inspecting apparatus for foreign matter and inspecting mechanism th...

Inspecting method and apparatus for foreign matter

Inspecting apparatus for foreign matter

Integrated soft bag inspection system

Code recognition method and system for rotating body

Foreign matter detecting system

Control method for factory automation system

Print inspection method, print inspection apparatus and automatic p...

Patents Applicationslast 30 patents

Inspecting apparatus and method for foreign matter

Inspecting apparatus for foreign matter

Inspecting apparatus for foreign matter and inspecting mechanism th...

Inspecting method and apparatus for foreign matter

Trademarklast 30 trademarks