SCIENTA OMICRON AB

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UPPSALA, SE

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Patents Grantslast 30 patents

Information Patent Grant
Aperture device and analyzer arrangement
- Patent number 11,942,316
- Issue date Mar 26, 2024
- SCIENTA OMICRON AB
- Peter Amann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hard X-ray photoelectron spectroscopy system
- Patent number 11,002,693
- Issue date May 11, 2021
- SCIENTA OMICRON AB
- Tomas Wiell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,978,579
- Issue date May 22, 2018
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,437,408
- Issue date Sep 6, 2016
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE SPECTROMETER
- Publication number 20240331993
- Publication date Oct 3, 2024
- SCIENTA OMICRON AB
- Patrik KARLSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ILLUMINATION CONTROL DEVICE FOR A CHARGED PARTICLE ANALYSER
- Publication number 20240310309
- Publication date Sep 19, 2024
- SCIENTA OMICRON AB
- Mikael OLOFSSON
- G01 - MEASURING TESTING
Information Patent Application
ANGLE-RESOLVING PHOTOELECTRON SPECTROMETER AND METHOD
- Publication number 20240110882
- Publication date Apr 4, 2024
- SCIENTA OMICRON AB
- Mikael OLOFSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-...
- Publication number 20230314351
- Publication date Oct 5, 2023
- SCIENTA OMICRON AB
- Jan KNUDSEN
- G01 - MEASURING TESTING
Information Patent Application
APERTURE DEVICE AND ANALYSER ARRANGEMENT
- Publication number 20220020580
- Publication date Jan 20, 2022
- SCIENTA OMICRON AB
- Peter AMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HARD X-RAY PHOTOELECTRON SPECTROSCOPY SYSTEM
- Publication number 20210010960
- Publication date Jan 14, 2021
- SCIENTA OMICRON AB
- Tomas WIELL
- G01 - MEASURING TESTING
Information Patent Application
HARD X-RAY PHOTOELECTRON SPECTROSCOPY ARRANGEMENT AND SYSTEM
- Publication number 20200103358
- Publication date Apr 2, 2020
- SCIENTA OMICRON AB
- Tomas WIELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20180269054
- Publication date Sep 20, 2018
- SCIENTA OMICRON AB
- Björn WANNBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20160336166
- Publication date Nov 17, 2016
- SCIENTA OMICRON AB
- Björn WANNBERG
- H01 - BASIC ELECTRIC ELEMENTS

SCIENTA OMICRON AB

Organization

Patents Grantslast 30 patents

Aperture device and analyzer arrangement

Hard X-ray photoelectron spectroscopy system

Analyser arrangement for particle spectrometer

Analyser arrangement for particle spectrometer

Patents Applicationslast 30 patents

CHARGED PARTICLE SPECTROMETER

AN ILLUMINATION CONTROL DEVICE FOR A CHARGED PARTICLE ANALYSER

ANGLE-RESOLVING PHOTOELECTRON SPECTROMETER AND METHOD

COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-...

APERTURE DEVICE AND ANALYSER ARRANGEMENT

HARD X-RAY PHOTOELECTRON SPECTROSCOPY SYSTEM

HARD X-RAY PHOTOELECTRON SPECTROSCOPY ARRANGEMENT AND SYSTEM

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

Trademarklast 30 trademarks