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Patents Grantslast 30 patents

Information Patent Grant
Nondestructive optical technique for simultaneously measuring optic...
- Patent number 7,463,355
- Issue date Dec 9, 2008
- Scientific Computing International
- Emad Zawaideh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Spectroscopic ellipsometry system for thin film imaging
- Publication number 20230010806
- Publication date Jan 12, 2023
- Scientific Computing International
- Emad Zawaideh
- G01 - MEASURING TESTING

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