SEH America, Inc.

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Vancouver, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Ammonia reclamation system
- Patent number 7,229,601
- Issue date Jun 12, 2007
- SEH America, Inc.
- Brian L. Tansy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Lapping carrier, apparatus for lapping a wafer and method of fabric...
- Patent number 7,196,009
- Issue date Mar 27, 2007
- SEH America, Inc.
- Brian L. Bex
- B24 - GRINDING POLISHING
Information Patent Grant
Low pressure check valve
- Patent number 7,137,405
- Issue date Nov 21, 2006
- SEH America, Inc.
- Richard F. Barrows
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method of producing a high resistivity SIMOX silicon substrate
- Patent number 7,112,509
- Issue date Sep 26, 2006
- Ibis Technology Corporation
- Yuri Erokhin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for recycling slurry
- Patent number 7,059,943
- Issue date Jun 13, 2006
- SEH America, Inc.
- Scott Cann
- B24 - GRINDING POLISHING
Information Patent Grant
Method of determining nitrogen concentration within a wafer
- Patent number 6,896,727
- Issue date May 24, 2005
- SEH America, Inc.
- Sergei V. Koveshnikov
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system and method for cutting a crystal ingot
- Patent number 6,889,684
- Issue date May 10, 2005
- SEH America, Inc.
- Shawn V. McAulay
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of reducing particulate contamination during polishing of a...
- Patent number 6,849,548
- Issue date Feb 1, 2005
- SEH America, Inc.
- Steven P. Cooper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for isolation of wafer support-related crystal defects
- Patent number 6,825,487
- Issue date Nov 30, 2004
- SEH America, Inc.
- Brazel G. Preece
- G01 - MEASURING TESTING
Information Patent Grant
In-situ post epitaxial treatment process
- Patent number 6,808,564
- Issue date Oct 26, 2004
- SEH America, Inc.
- Gerald R. Dietze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for predicting oxygen-induced stacking fault...
- Patent number 6,798,526
- Issue date Sep 28, 2004
- SEH America, Inc.
- Timothy L. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing an SOI wafer
- Patent number 6,794,227
- Issue date Sep 21, 2004
- SEH America, Inc.
- Sergei V. Koveshnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for collecting, storing, and displaying process d...
- Patent number 6,773,932
- Issue date Aug 10, 2004
- SEH America, Inc.
- Michael M. Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and computer program products for characterizing a crystall...
- Patent number 6,768,965
- Issue date Jul 27, 2004
- SEH America, Inc.
- Stephen L. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for orienting a crystalline body during radiat...
- Patent number 6,760,403
- Issue date Jul 6, 2004
- SEH America, Inc.
- Richard M. Aydelott
- G01 - MEASURING TESTING
Information Patent Grant
Method for seasoning a polishing pad
- Patent number 6,743,080
- Issue date Jun 1, 2004
- SEH America, Inc.
- Phillip P. Truong
- B24 - GRINDING POLISHING
Information Patent Grant
Method for lapping a wafer
- Patent number 6,733,368
- Issue date May 11, 2004
- SEH America, Inc.
- Yi Pan
- B24 - GRINDING POLISHING
Information Patent Grant
Growth of epitaxial semiconductor material with improved crystallog...
- Patent number 6,703,290
- Issue date Mar 9, 2004
- SEH America, Inc.
- Mark R. Boydston
- C30 - CRYSTAL GROWTH
Information Patent Grant
Sound enhanced lapping apparatus
- Patent number 6,676,489
- Issue date Jan 13, 2004
- SEH America, Inc.
- Bettina M. Fitzgerald
- B24 - GRINDING POLISHING
Information Patent Grant
High resistivity silicon wafer having electrically inactive dopant...
- Patent number 6,673,147
- Issue date Jan 6, 2004
- SEH America, Inc.
- Oleg V. Kononchuk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing a high resistivity silicon wafer utilizing heat...
- Patent number 6,669,777
- Issue date Dec 30, 2003
- SEH America, Inc.
- Oleg V. Kononchuk
- C30 - CRYSTAL GROWTH
Information Patent Grant
High resistivity silicon wafer produced by a controlled pull rate c...
- Patent number 6,669,775
- Issue date Dec 30, 2003
- SEH America, Inc.
- Oleg V. Kononchuk
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of growing large-diameter dislocation-free <110&#x00...
- Patent number 6,652,824
- Issue date Nov 25, 2003
- SEH America, Inc.
- Rosemary T. Nettleton
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Bromine biocide removal
- Patent number 6,649,065
- Issue date Nov 18, 2003
- SEH America, Inc.
- Allen R. Boyce
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Method for evaluating impurity concentrations in epitaxial susceptors
- Patent number 6,649,427
- Issue date Nov 18, 2003
- SEH America, Inc.
- Sergei V. Koveshnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating impurity concentrations in epitaxial reagent...
- Patent number 6,632,688
- Issue date Oct 14, 2003
- SEH America, Inc.
- Sergei V. Koveshnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimized silicon wafer gettering for advanced semiconductor devices
- Patent number 6,632,277
- Issue date Oct 14, 2003
- SEH America, Inc.
- Gerald R. Dietze
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for evaluating impurity concentrations in unpolished wafers...
- Patent number 6,630,363
- Issue date Oct 7, 2003
- SEH America, Inc.
- Sergei V. Koveshnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating impurity concentrations in semiconductor subs...
- Patent number 6,620,632
- Issue date Sep 16, 2003
- SEH America, Inc.
- Sergei V. Koveshnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recycling heat from industrial processes to generate electricity us...
- Patent number 6,620,998
- Issue date Sep 16, 2003
- SEH America, Inc.
- Neil F. Salstrom
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
Wafer polishing template for polishing semiconductor wafers in a wa...
- Publication number 20060211349
- Publication date Sep 21, 2006
- SEH America, Inc.
- Francisco Javier Gaeta
- B24 - GRINDING POLISHING
Information Patent Application
Support fixture for semiconductor wafers and associated fabrication...
- Publication number 20050229857
- Publication date Oct 20, 2005
- SEH America, Inc.
- David A. Beauchaine
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Ammonia reclamation system
- Publication number 20050175523
- Publication date Aug 11, 2005
- SEH America, Inc.
- Brian L. Tansy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Gettering filter and associated method for removing oxygen from a gas
- Publication number 20050053535
- Publication date Mar 10, 2005
- SEH America, Inc.
- David A. Beauchaine
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Lapping carrier, apparatus for lapping a wafer and method of fabric...
- Publication number 20040224522
- Publication date Nov 11, 2004
- SEH America, Inc.
- Brian L. Bex
- B24 - GRINDING POLISHING
Information Patent Application
METHOD OF PRODUCING A HIGH RESISTIVITY SIMOX SILICON SUBSTRATE
- Publication number 20040224477
- Publication date Nov 11, 2004
- IBIS TECHNOLOGY CORPORATION
- Yuri Erokhin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for locating an alignment feature of a crystalline body
- Publication number 20040213376
- Publication date Oct 28, 2004
- SEH America, Inc.
- Richard M. Aydelott
- G01 - MEASURING TESTING
Information Patent Application
System and method for collecting, storing, and displaying process d...
- Publication number 20040176916
- Publication date Sep 9, 2004
- SEH America, Inc.
- Michael M. Robinson
- G01 - MEASURING TESTING
Information Patent Application
Method for fabricating a wafer including dry etching the edge of th...
- Publication number 20040157461
- Publication date Aug 12, 2004
- SEH America, Inc.
- Oleg V. Kononchuk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus, system and method for cutting a crystal ingot
- Publication number 20040084042
- Publication date May 6, 2004
- SEH America, Inc.
- Shawn V. McAulay
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Quartz to quartz seal using expanded PTFE gasket material
- Publication number 20040060519
- Publication date Apr 1, 2004
- SEH AMERICA INC.
- David A. Beauchaine
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Internal diameter cutting blades and methods
- Publication number 20040038629
- Publication date Feb 26, 2004
- SEH America, Inc.
- Jesse B. Griggs
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for isolation of wafer support-related crystal defects
- Publication number 20040021097
- Publication date Feb 5, 2004
- SEH America, Inc.
- Brazel G. Preece
- G01 - MEASURING TESTING
Information Patent Application
Method for seasoning a polishing pad
- Publication number 20040023597
- Publication date Feb 5, 2004
- SEH America, Inc.
- Phillip P. Truong
- B24 - GRINDING POLISHING
Information Patent Application
Systems, methods and computer program products for determining cont...
- Publication number 20040010394
- Publication date Jan 15, 2004
- SEH America, Inc.
- Sergei V. Koveshnikov
- G01 - MEASURING TESTING
Information Patent Application
Methods and computer program products for characterizing a crystall...
- Publication number 20030200047
- Publication date Oct 23, 2003
- SEH America, Inc.
- Stephen L. Martin
- G01 - MEASURING TESTING
Information Patent Application
Method of reducing particulate contamination during polishing of a...
- Publication number 20030190810
- Publication date Oct 9, 2003
- SEH America, Inc.
- Steven P. Cooper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for assigning and reporting preventative maintena...
- Publication number 20030158770
- Publication date Aug 21, 2003
- SEH America, Inc.
- Leif Carlson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for reporting, assigning, and tracking facilities...
- Publication number 20030135378
- Publication date Jul 17, 2003
- SEH America, Inc.
- Leif Carlson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
High resistivity silicon wafer having electrically inactive dopant...
- Publication number 20030106482
- Publication date Jun 12, 2003
- SEH America, Inc.
- Oleg V. Kononchuk
- C30 - CRYSTAL GROWTH
Information Patent Application
HIGH RESISTIVITY SILICON WAFER WITH THICK EPITAXIAL LAYER AND METHO...
- Publication number 20030109115
- Publication date Jun 12, 2003
- SEH Amercia, Inc.
- Oleg V. Kononchuk
- C30 - CRYSTAL GROWTH
Information Patent Application
HIGH RESISTIVITY SILICON WAFER AND METHOD OF PRODUCING SAME USING T...
- Publication number 20030106485
- Publication date Jun 12, 2003
- SEH America, Inc.
- Oleg V. Kononchuk
- C30 - CRYSTAL GROWTH
Information Patent Application
Method of producing a high resistivity silicon wafer utilizing heat...
- Publication number 20030106486
- Publication date Jun 12, 2003
- SEH America, Inc.
- Oleg V. Kononchuk
- C30 - CRYSTAL GROWTH
Information Patent Application
Growth of epitaxial semiconductor material with improved crystallog...
- Publication number 20030109095
- Publication date Jun 12, 2003
- SEH America, Inc.
- Mark R. Boydston
- C30 - CRYSTAL GROWTH
Information Patent Application
High resistivity silicon wafer produced by a controlled pull rate c...
- Publication number 20030106481
- Publication date Jun 12, 2003
- SEH America, Inc.
- Oleg V. Kononchuk
- C30 - CRYSTAL GROWTH
Information Patent Application
System and method for collecting, storing, and displaying process d...
- Publication number 20030105546
- Publication date Jun 5, 2003
- SEH America, Inc.
- Michael M. Robinson
- G01 - MEASURING TESTING
Information Patent Application
Method of growing large-diameter dislocation-free <110> crystalline...
- Publication number 20030097975
- Publication date May 29, 2003
- SEH America, Inc.
- Rosemary T. Nettleton
- C30 - CRYSTAL GROWTH
Information Patent Application
Recycling heat from industrial processes to generate electricity us...
- Publication number 20030079773
- Publication date May 1, 2003
- SEH America, Inc.
- Neil F. Salstrom
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Method and apparatus for orienting a crystalline body during radiat...
- Publication number 20030081723
- Publication date May 1, 2003
- SEH America, Inc.
- Richard M. Aydelott
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for recycling slurry
- Publication number 20030003851
- Publication date Jan 2, 2003
- SEH America, Inc.
- Scott Cann
- B24 - GRINDING POLISHING

SEH America, Inc.

Organization

Patents Grantslast 30 patents

Ammonia reclamation system

Lapping carrier, apparatus for lapping a wafer and method of fabric...

Low pressure check valve

Method of producing a high resistivity SIMOX silicon substrate

Method and apparatus for recycling slurry

Method of determining nitrogen concentration within a wafer

Apparatus, system and method for cutting a crystal ingot

Method of reducing particulate contamination during polishing of a...

Method for isolation of wafer support-related crystal defects

In-situ post epitaxial treatment process

Methods and apparatus for predicting oxygen-induced stacking fault...

Method of producing an SOI wafer

System and method for collecting, storing, and displaying process d...

Methods and computer program products for characterizing a crystall...

Method and apparatus for orienting a crystalline body during radiat...

Method for seasoning a polishing pad

Method for lapping a wafer

Growth of epitaxial semiconductor material with improved crystallog...

Sound enhanced lapping apparatus

High resistivity silicon wafer having electrically inactive dopant...

Method of producing a high resistivity silicon wafer utilizing heat...

High resistivity silicon wafer produced by a controlled pull rate c...

Method of growing large-diameter dislocation-free &#x0003C;110&#x00...

Bromine biocide removal

Method for evaluating impurity concentrations in epitaxial susceptors

Method for evaluating impurity concentrations in epitaxial reagent...

Optimized silicon wafer gettering for advanced semiconductor devices

Method for evaluating impurity concentrations in unpolished wafers...

Method for evaluating impurity concentrations in semiconductor subs...

Recycling heat from industrial processes to generate electricity us...

Patents Applicationslast 30 patents

Wafer polishing template for polishing semiconductor wafers in a wa...

Support fixture for semiconductor wafers and associated fabrication...

Ammonia reclamation system

Gettering filter and associated method for removing oxygen from a gas

Lapping carrier, apparatus for lapping a wafer and method of fabric...

METHOD OF PRODUCING A HIGH RESISTIVITY SIMOX SILICON SUBSTRATE

Method for locating an alignment feature of a crystalline body

System and method for collecting, storing, and displaying process d...

Method for fabricating a wafer including dry etching the edge of th...

Apparatus, system and method for cutting a crystal ingot

Quartz to quartz seal using expanded PTFE gasket material

Internal diameter cutting blades and methods

Method for isolation of wafer support-related crystal defects

Method for seasoning a polishing pad

Systems, methods and computer program products for determining cont...

Methods and computer program products for characterizing a crystall...

Method of reducing particulate contamination during polishing of a...

Method and system for assigning and reporting preventative maintena...

Method and system for reporting, assigning, and tracking facilities...

High resistivity silicon wafer having electrically inactive dopant...

HIGH RESISTIVITY SILICON WAFER WITH THICK EPITAXIAL LAYER AND METHO...

HIGH RESISTIVITY SILICON WAFER AND METHOD OF PRODUCING SAME USING T...

Method of producing a high resistivity silicon wafer utilizing heat...

Growth of epitaxial semiconductor material with improved crystallog...

High resistivity silicon wafer produced by a controlled pull rate c...

System and method for collecting, storing, and displaying process d...

Method of growing large-diameter dislocation-free <110> crystalline...

Recycling heat from industrial processes to generate electricity us...

Method and apparatus for orienting a crystalline body during radiat...

Method and apparatus for recycling slurry

Trademarklast 30 trademarks

Method of growing large-diameter dislocation-free <110&#x00...