SEIKO NPC CORPORATION

Organization

TOKYO, JP

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Signal processing circuit, physical quantity detection apparatus, a...
- Patent number 9,046,366
- Issue date Jun 2, 2015
- Seiko Epson Corporation
- Yoshinao Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit, physical quantity detection apparatus, angular v...
- Patent number 8,850,887
- Issue date Oct 7, 2014
- Seiko Epson Corporation
- Yoshinao Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Angular velocity detection apparatus
- Patent number 8,618,890
- Issue date Dec 31, 2013
- Seiko Epson Corporation
- Yoshinao Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity detection apparatus, method of controlling physic...
- Patent number 8,375,790
- Issue date Feb 19, 2013
- Epson Toyocom Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Angular rate detection apparatus providing stable output
- Patent number 8,141,425
- Issue date Mar 27, 2012
- Seiko NPC Corporation
- Shinnosuke Kano
- G01 - MEASURING TESTING
Information Patent Grant
Oscillation circuit with temperature compensation
- Patent number 7,880,553
- Issue date Feb 1, 2011
- Seiko NPC Kabushiki Kaisha
- Jun Kikuchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor nonvolatile storage element and method of fabricating...
- Patent number 7,667,252
- Issue date Feb 23, 2010
- National Institute of Advanced Industrial Science and Technology
- Shigeki Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for measuring physical quantities
- Patent number 7,441,458
- Issue date Oct 28, 2008
- NGK Insulators, Ltd.
- Shoji Yokoi
- G01 - MEASURING TESTING
Information Patent Grant
Spread spectrum type clock generation circuit for improving frequen...
- Patent number 7,397,883
- Issue date Jul 8, 2008
- Seiko NPC Corporation
- Yuji Hattori
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Charge pump circuit reducing noise and charge error and PLL circuit...
- Patent number 7,271,619
- Issue date Sep 18, 2007
- Seiko NPC Corporation
- Hiroshi Kawago
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Image detection processor and image detection processing method
- Patent number 7,176,432
- Issue date Feb 13, 2007
- Seiko NPC Corporation
- Yasuhiro Komiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor device and a signal amplification device of a small detectio...
- Patent number 7,161,419
- Issue date Jan 9, 2007
- Seiko NPC Corporation
- Koryo Tei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Bias voltage generator circuit
- Patent number 7,129,776
- Issue date Oct 31, 2006
- Seiko NPC Corporation
- Shinichi Watanabe
- G05 - CONTROLLING REGULATING
Information Patent Grant
MOS-type variable capacitance element and voltage control oscillati...
- Patent number 7,091,797
- Issue date Aug 15, 2006
- Seiko NPC Corporation
- Masashi Takamatsu
- H01 - BASIC ELECTRIC ELEMENTS

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL DEVICE AND METHOD OF MANUFACTURING OPTICAL DEVICE
- Publication number 20240038747
- Publication date Feb 1, 2024
- SEIKO NPC CORPORATION
- Takahiro NAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRIVER CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR VELO...
- Publication number 20130057354
- Publication date Mar 7, 2013
- SEIKO NPC CORPORATION
- Yoshinao YANAGISAWA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR V...
- Publication number 20130055810
- Publication date Mar 7, 2013
- SEIKO NPC CORPORATION
- Yoshinao YANAGISAWA
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, A...
- Publication number 20130055815
- Publication date Mar 7, 2013
- SEIKO NPC CORPORATION
- Yoshinao YANAGISAWA
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY DETECTION APPARATUS, METHOD OF CONTROLLING PHYSIC...
- Publication number 20100326189
- Publication date Dec 30, 2010
- EPSON TOYOCOM CORPORATION
- Kenji Sato
- G01 - MEASURING TESTING

SEIKO NPC CORPORATION

Organization

Patents Grantslast 30 patents

Signal processing circuit, physical quantity detection apparatus, a...

Detection circuit, physical quantity detection apparatus, angular v...

Angular velocity detection apparatus

Physical quantity detection apparatus, method of controlling physic...

Angular rate detection apparatus providing stable output

Oscillation circuit with temperature compensation

Semiconductor nonvolatile storage element and method of fabricating...

Systems for measuring physical quantities

Spread spectrum type clock generation circuit for improving frequen...

Charge pump circuit reducing noise and charge error and PLL circuit...

Image detection processor and image detection processing method

Sensor device and a signal amplification device of a small detectio...

Bias voltage generator circuit

MOS-type variable capacitance element and voltage control oscillati...

Patents Applicationslast 30 patents

OPTICAL DEVICE AND METHOD OF MANUFACTURING OPTICAL DEVICE

DRIVER CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR VELO...

DETECTION CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR V...

SIGNAL PROCESSING CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, A...

PHYSICAL QUANTITY DETECTION APPARATUS, METHOD OF CONTROLLING PHYSIC...