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Seiwa Optical Co., Ltd.

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Organization

  • SAN FRANCISCO, CA, US
Organizations

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE APPARATUS AND PROBE METHOD
    • Publication number 20160161553
    • Publication date Jun 9, 2016
    • TOKYO ELECTRON LIMITED
    • Muneaki TAMURA
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks

  • Information Trademark

    86313365 - SEIWA
    • Serial number 86313365
    • Registration number 5595891
    • Filing date Jun 18, 2014
    • Seiwa Optical Co., Ltd.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
  • Information Trademark

    76255157 - CORRECT
    • Serial number 76255157
    • Registration number 2760759
    • Filing date May 10, 2001
    • Seiwa Optical Co., Ltd.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments