SEMICAPS Pte Ltd

Organization

The Fleming, SG

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for cooling a semiconductor device
- Patent number 9,917,034
- Issue date Mar 13, 2018
- Semicaps Pte Ltd.
- Choon Meng Chua
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for cooling a semiconductor device
- Patent number 8,891,240
- Issue date Nov 18, 2014
- Semicaps Pte Ltd.
- Choon Meng Chua
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer stage
- Patent number 8,436,631
- Issue date May 7, 2013
- Semicaps Pte Ltd.
- Choon Meng Chua
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for measuring laser induced phenomena changes in...
- Patent number 8,278,959
- Issue date Oct 2, 2012
- Semicaps Pte Ltd.
- Choon Meng Chua
- G01 - MEASURING TESTING
Information Patent Grant
Solid immersion lens optics assembly
- Patent number 8,072,699
- Issue date Dec 6, 2011
- Semicaps Pte Ltd.
- Lian Ser Koh
- G02 - OPTICS
Information Patent Grant
Method of testing an electronic circuit and apparatus thereof
- Patent number 7,623,982
- Issue date Nov 24, 2009
- Semicaps Pte Ltd.
- Choon Meng Chua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for measuring laser induced phenomena changes in...
- Patent number 7,456,032
- Issue date Nov 25, 2008
- Semicaps Pte Ltd.
- Choon Meng Chua
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam induced phenomena detection
- Patent number 6,897,664
- Issue date May 24, 2005
- Advanced Micro Devices, Inc.
- Michael Bruce
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR COOLING A SEMICONDUCTOR DEVICE
- Publication number 20160093554
- Publication date Mar 31, 2016
- SEMICAPS PTE LTD.
- Choon Meng CHUA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER STAGE
- Publication number 20130241587
- Publication date Sep 19, 2013
- SEMICAPS PTE LTD.
- Choon Meng Chua
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR COOLING A SEMICONDUCTOR DEVICE
- Publication number 20120120599
- Publication date May 17, 2012
- SEMICAPS PTE LTD
- Choon Meng CHUA
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
SOLID IMMERSION LENS OPTICS ASSEMBLY
- Publication number 20100321678
- Publication date Dec 23, 2010
- SEMICAPS PTE LTD.
- Lian Ser Koh
- G02 - OPTICS
Information Patent Application
WAFER STAGE
- Publication number 20100315617
- Publication date Dec 16, 2010
- SEMICAPS PTE LTD.
- Choon Meng Chua
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR MEASURING LASER INDUCED PHENOMENA CHANGES IN...
- Publication number 20100156451
- Publication date Jun 24, 2010
- SEMICAPS PTE LTD.
- Choon Meng Chua
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING AN ELECTRONIC CIRCUIT AND APPARATUS THEREOF
- Publication number 20090119042
- Publication date May 7, 2009
- SEMICAPS PTE LTD.
- CHUA CHOON MENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for measuring laser induced phenomena changes in...
- Publication number 20060284625
- Publication date Dec 21, 2006
- SEMICAPS Pte Ltd
- Choon Meng Chua
- G01 - MEASURING TESTING

SEMICAPS Pte Ltd

Organization

Patents Grantslast 30 patents

Method and apparatus for cooling a semiconductor device

Apparatus and method for cooling a semiconductor device

Wafer stage

Method and system for measuring laser induced phenomena changes in...

Solid immersion lens optics assembly

Method of testing an electronic circuit and apparatus thereof

Method and system for measuring laser induced phenomena changes in...

Laser beam induced phenomena detection

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR COOLING A SEMICONDUCTOR DEVICE

WAFER STAGE

APPARATUS AND METHOD FOR COOLING A SEMICONDUCTOR DEVICE

SOLID IMMERSION LENS OPTICS ASSEMBLY

WAFER STAGE

METHOD AND SYSTEM FOR MEASURING LASER INDUCED PHENOMENA CHANGES IN...

METHOD OF TESTING AN ELECTRONIC CIRCUIT AND APPARATUS THEREOF

Method and system for measuring laser induced phenomena changes in...