Semiconductor 300 GmbH & Co. KG

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for optically monitoring fabrication processes of...
- Patent number 7,003,149
- Issue date Feb 21, 2006
- Semiconductor 300 GmbH & Co. KG
- Norbert Benesch
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of wafer grinding
- Patent number 6,752,694
- Issue date Jun 22, 2004
- Motorola, Inc.
- Manfred Schneegans
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for measuring the degradation of a tool
- Patent number 6,633,379
- Issue date Oct 14, 2003
- Semiconductor 300 GmbH & Co. KG
- Michael Roesner
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device for performing surface treatment on semiconductor wafers
- Patent number 6,564,469
- Issue date May 20, 2003
- Motorola, Inc.
- Mohamad Jahanbani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of filling gaps on a semiconductor wafer
- Patent number 6,562,734
- Issue date May 13, 2003
- Semiconductor 300 GmbH & Co. KG
- Markus Kirchhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor devices with contact studs form...
- Patent number 6,486,049
- Issue date Nov 26, 2002
- Motorola, Inc.
- John Maltabes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retaining ring for chemical-mechanical polishing (CMP) head, polish...
- Patent number 6,419,567
- Issue date Jul 16, 2002
- Semiconductor 300 GmbH & Co. KG
- Walter Glashauser
- B24 - GRINDING POLISHING
Information Patent Grant
Plasma-enhanced chemical vapor deposition (CVD) method to fill a tr...
- Patent number 6,362,098
- Issue date Mar 26, 2002
- Motorola, Inc.
- Terry Alan Breeden
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for heating a semiconductor wafer in a process chamber by a...
- Patent number 6,290,491
- Issue date Sep 18, 2001
- Motorola, Inc.
- Iraj Shahvandi
- C30 - CRYSTAL GROWTH

Semiconductor 300 GmbH & Co. KG

Organization

Patents Grantslast 30 patents

Method and device for optically monitoring fabrication processes of...

Apparatus for and method of wafer grinding

Apparatus and method for measuring the degradation of a tool

Device for performing surface treatment on semiconductor wafers

Method of filling gaps on a semiconductor wafer

Method of fabricating semiconductor devices with contact studs form...

Retaining ring for chemical-mechanical polishing (CMP) head, polish...

Plasma-enhanced chemical vapor deposition (CVD) method to fill a tr...

Method for heating a semiconductor wafer in a process chamber by a...

Patents Applicationslast 30 patents

Trademarklast 30 trademarks