Semiconductor Physics Laboratory Co., Ltd.

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Budapest, HU

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Patents Grantslast 30 patents

Information Patent Grant
Accurate measurement of excess carrier lifetime using carrier decay...
- Patent number 8,912,799
- Issue date Dec 16, 2014
- Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method for chemical surface passivation for in-situ bulk lifetime m...
- Patent number 5,580,828
- Issue date Dec 3, 1996
- Semiconductor Physics Laboratory RT
- Gyorgy Ferenczi
- G01 - MEASURING TESTING
Information Patent Grant
Method for stabilizing the effective dissolution valence of silicon...
- Patent number 5,300,200
- Issue date Apr 5, 1994
- Semiconductor Physics Laboratory RT
- Tamas S. Horanyi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
ACCURATE MEASUREMENT OF EXCESS CARRIER LIFETIME USING CARRIER DECAY...
- Publication number 20130169283
- Publication date Jul 4, 2013
- Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
88632605 - CNCV
- Serial number 88632605
- Registration number 6042055
- Filing date Sep 26, 2019
- Semiconductor Physics Laboratory Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88632625 - SEMILAB
- Serial number 88632625
- Registration number 6042056
- Filing date Sep 26, 2019
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments