Semiconductor Technologies & Instruments

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
3-D lead inspection
- Patent number 6,532,063
- Issue date Mar 11, 2003
- Semiconductor Technologies & Instruments
- Seow Hoon Tan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for transferring components between packing media
- Patent number 6,151,864
- Issue date Nov 28, 2000
- Semiconductor Technologies & Instruments
- Han Chin Fong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

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