Semitex Co., Ltd.

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating lifetime of semiconductor material and apparat...
- Patent number 5,451,886
- Issue date Sep 19, 1995
- School Judicial Person Ikutoku Gakuen
- Yoichiro Ogita
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring lifetime of semiconductor materi...
- Patent number 5,138,255
- Issue date Aug 11, 1992
- Semitex Co., Ltd.
- Tateo Kusama
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring lifetime of semiconductor material and apparat...
- Patent number 5,081,414
- Issue date Jan 14, 1992
- Semitex Co., Ltd.
- Tateo Kusama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring a deep impurity level of a semic...
- Patent number 5,047,713
- Issue date Sep 10, 1991
- Semitex Co., Ltd.
- Yoshio Kirino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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