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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring the profile of flat objects compris...
- Patent number 12,235,209
- Issue date Feb 25, 2025
- SENTRONICS METROLOGY GMBH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring height profiles on an object
- Patent number 12,025,424
- Issue date Jul 2, 2024
- SENTRONICS METROLOGY GMBH
- Bernd Srocka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR MEASURING THE PROFILE OF FLAT OBJECTS COMPRIS...
- Publication number 20220390355
- Publication date Dec 8, 2022
- SENTRONICS METROLOGY GMBH
- Bernd SROCKA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING HEIGHT PROFILES ON AN OBJECT
- Publication number 20220268569
- Publication date Aug 25, 2022
- SENTRONICS METROLOGY GMBH
- Bernd SROCKA
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
79399904 - WAFER METROLOGY CENTER
- Serial number 79399904
- Filing date Jun 4, 2024
- sentronics metrology GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79197401 - WAFER METROLOGY CENTER
- Serial number 79197401
- Registration number 5352556
- Filing date May 10, 2016
- sentronics metrology GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments